JAJSI69A October   2006  – November 2019 SN65LBC174A-EP

PRODUCTION DATA.  

  1. 1特長
  2. 2アプリケーション
  3. 3概要
    1.     Device Images
      1.      ロジック図 (正論理)
  4. 4改訂履歴
  5. 5概要（続き）
    1. 5.1 Pin Configuration and Functions
      1.      Pin Functions
    2. 5.2 Specifications
      1. 5.2.1 Absolute Maximum Ratings
      2. 5.2.2 ESD Ratings
      3. 5.2.3 Recommended Operating Conditions
      4. 5.2.4 Thermal Information
      5. 5.2.5 Electrical Characteristics
      6. 5.2.6 Switching Characteristics
      7. 5.2.7 Typical Characteristics
    3. 5.3 Parameter Measurement Information
    4. 5.4 Detailed Description
      1. 5.4.1 Overview
      2. 5.4.2 Functional Block Diagram
      3. 5.4.3 Feature Description
      4. 5.4.4 Device Functional Modes
    5. 5.5 Application and Implementation
      1. 5.5.1 Application Information
      2. 5.5.2 Typical Application
        1. 5.5.2.1 Design Requirements
        2. 5.5.2.2 Detailed Design Procedure
        3. 5.5.2.3 Application Curve
    6. 5.6 Power Supply Recommendations
    7. 5.7 Layout
      1. 5.7.1 Layout Guidelines
      2. 5.7.2 Layout Example
  6. 6デバイスおよびドキュメントのサポート
    1. 6.1 ドキュメントの更新通知を受け取る方法
    2. 6.2 サポート・リソース
    3. 6.3 商標
    4. 6.4 静電気放電に関する注意事項
    5. 6.5 Glossary
  7. 7メカニカル、パッケージ、および注文情報

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

5.2.1 Absolute Maximum Ratings(1)

over operating free-air temperature range (unless otherwise noted)
MIN MAX UNIT
VCC Supply voltage(2) –0.3 6 V
Voltage at any bus (dc) –10 15 V
Voltage at any bus (transient pulse through 100 Ω, See Figure 14) –30 30 V
VI Input voltage at any A or EN terminal –0.5 VCC + 0.5 V
Tstg Storage temperature(3) –65 150 °C
Lead temperature 1.6 mm (1/16 in) from case for 10 s 260 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values, except differential I/O bus voltages, are with respect to GND.
(3) Long-term high-temperature storage and/or extended use at maximum recommended operating conditions may result in a reduction of overall device life.