JAJSQG6A september   2003  – june 2023 SN74AC08-EP

PRODUCTION DATA  

  1.   1
  2. 1特長
  3. 2概要
  4. 3Revision History
  5. 4Pin Configuration and Functions
  6. 5Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 Recommended Operating Conditions
    3. 5.3 Thermal Information
    4. 5.4 Electrical Characteristics
    5. 5.5 Switching Characteristics, VCC = 3.3 V ± 0.3 V
    6. 5.6 Switching Characteristics, VCC = 5 V ± 0.5 V
    7. 5.7 Operating Characteristics
  7. 6Parameter Measurement Information
  8. 7Detailed Description
    1. 7.1 Functional Block Diagram
    2. 7.2 Device Functional Modes
  9. 8Device and Documentation Support
    1. 8.1 ドキュメントの更新通知を受け取る方法
    2. 8.2 サポート・リソース
    3. 8.3 Trademarks
    4. 8.4 静電気放電に関する注意事項
    5. 8.5 用語集
  10. 9Mechanical, Packaging, and Orderable Information

パッケージ・オプション

デバイスごとのパッケージ図は、PDF版データシートをご参照ください。

メカニカル・データ（パッケージ｜ピン）
  • D|14
サーマルパッド・メカニカル・データ
発注情報

4 Pin Configuration and Functions

GUID-E94E9BC0-B499-46A3-9DBF-6C4FDB486178-low.pngFigure 4-1 D Package (Top View)
Table 4-1 Pin Functions
PINTYPEDESCRIPTION
NAMENO.
1A1InputChannel 1, Input A
1B2InputChannel 1, Input B
1Y3OutputChannel 1, Output Y
2A4InputChannel 2, Input A
2B5InputChannel 2, Input B
2Y6OutputChannel 2, Output Y
GND7—Ground
3Y8OutputChannel 3, Output Y
3A9InputChannel 3, Input A
3B10InputChannel 3, Input B
4Y11OutputChannel 4, Output Y
4A12InputChannel 4, Input A
4B13InputChannel 4, Input B
VCC14—Positive Supply
†. Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.