JAJSJQ8J October   2004  – September 2020 SN74AUP1T97

PRODUCTION DATA  

  1. 1特長
  2. 2概要
  3. 3Revision History
  4. 4Pin Configuration and Functions
  5. 5Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information
    5. 5.5  Thermal Information
    6. 5.6  Electrical Characteristics
    7. 5.7  Switching Characteristics
    8. 5.8  Switching Characteristics
    9. 5.9  Switching Characteristics
    10. 5.10 Switching Characteristics
    11. 5.11 Switching Characteristics
    12. 5.12 Switching Characteristics
    13. 5.13 Operating Characteristics
    14. 5.14 Typical Characteristics
  6. 6Parameter Measurement Information
  7. 7Detailed Description
    1. 7.1 Functional Block Diagram
    2. 7.2 Feature Description
    3. 7.3 Device Functional Modes
      1. 7.3.1 Logic Configurations
  8. 8Device and Documentation Support
    1. 8.1 Documentation Support
      1. 8.1.1 Related Documentation
    2. 8.2 Receiving Notification of Documentation Updates
    3. 8.3 Support Resources
    4. 8.4 Trademarks
    5. 8.5 Glossary
  9. 9Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ(パッケージ|ピン)
サーマルパッド・メカニカル・データ
発注情報

Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
MINMAXUNIT
VCCSupply voltage–0.54.6V
VIInput voltage(2)–0.54.6V
VOVoltage range applied to any output in the high-impedance or power-off state(2)–0.54.6V
VOOutput voltage range in the high or low state(2)–0.5VCC + 0.5V
IIKInput clamp currentVI < 0–50mA
IOKOutput clamp currentVO < 0–50mA
IOContinuous output current±20mA
Continuous current through VCC or GND±50mA
TstgStorage temperature–65150°C
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.