JAJSOY9C March   2020  – December 2022 TCAN1463-Q1

PRODUCTION DATA  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
  4. 4 Revision History
  5. 5 概要 (続き)
  6. 6 Pin Configuration and Functions
  7. 7 Specifications
    1. 7.1  Absolute Maximum Ratings
    2. 7.2  ESD Ratings
    3. 7.3  ESD Ratings - IEC Specifications
    4. 7.4  Recommended Operating Conditions
    5. 7.5  Thermal Information
    6. 7.6  Power Dissipation Ratings
    7. 7.7  Power Supply Characteristics
    8. 7.8  Electrical Characteristics
    9. 7.9  Timing Requirements
    10. 7.10 Switching Characteristics
    11. 7.11 Typical Characteristics
  8. 8 Parameter Measurement Information
  9. 9 Detailed Description
    1. 9.1 Overview
      1. 9.1.1 Signal Improvement
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
      1. 9.3.1 Supply Pins
        1. 9.3.1.1 VSUP Pin
        2. 9.3.1.2 VCC Pin
        3. 9.3.1.3 VIO Pin
      2. 9.3.2 Digital Inputs and Outputs
        1. 9.3.2.1 TXD Pin
        2. 9.3.2.2 RXD Pin
        3. 9.3.2.3 nFAULT Pin
        4. 9.3.2.4 EN Pin
        5. 9.3.2.5 nSTB Pin
        6. 9.3.2.6 INH_MASK Pin
      3. 9.3.3 GND
      4. 9.3.4 INH Pin
      5. 9.3.5 WAKE Pin
      6. 9.3.6 CAN Bus Pins
      7. 9.3.7 Faults
        1. 9.3.7.1 Internal and External Fault Indicators
          1. 9.3.7.1.1 Power-Up (PWRON Flag)
          2. 9.3.7.1.2 Wake-Up Request (WAKERQ Flag)
          3. 9.3.7.1.3 Undervoltage Faults
            1. 9.3.7.1.3.1 Undervoltage on VSUP
            2. 9.3.7.1.3.2 Undervoltage on VCC
            3. 9.3.7.1.3.3 Undervoltage on VIO
          4. 9.3.7.1.4 CAN Bus Fault (CBF Flag)
          5. 9.3.7.1.5 TXD Clamped Low (TXDCLP Flag)
          6. 9.3.7.1.6 TXD Dominant State Timeout (TXDDTO Flag)
          7. 9.3.7.1.7 TXD Shorted to RXD Fault (TXDRXD Flag)
          8. 9.3.7.1.8 CAN Bus Dominant Fault (CANDOM Flag)
      8. 9.3.8 Local Faults
        1. 9.3.8.1 TXD Clamped Low (TXDCLP)
        2. 9.3.8.2 TXD Dominant Timeout (TXD DTO)
        3. 9.3.8.3 Thermal Shutdown (TSD)
        4. 9.3.8.4 Undervoltage Lockout (UVLO)
        5. 9.3.8.5 Unpowered Devices
        6. 9.3.8.6 Floating Terminals
        7. 9.3.8.7 CAN Bus Short-Circuit Current Limiting
    4. 9.4 Device Functional Modes
      1. 9.4.1 Operating Mode Description
        1. 9.4.1.1 Normal Mode
        2. 9.4.1.2 Silent Mode
        3. 9.4.1.3 Standby Mode
        4. 9.4.1.4 Go-To-Sleep Mode
        5. 9.4.1.5 Sleep Mode
          1. 9.4.1.5.1 Remote Wake Request via Wake-Up Pattern (WUP)
          2. 9.4.1.5.2 Local Wake-Up (LWU) via WAKE Input Terminal
      2. 9.4.2 CAN Transceiver
        1. 9.4.2.1 CAN Transceiver Operation
          1. 9.4.2.1.1 CAN Transceiver Modes
            1. 9.4.2.1.1.1 CAN Off Mode
            2. 9.4.2.1.1.2 CAN Autonomous: Inactive and Active
            3. 9.4.2.1.1.3 CAN Active
          2. 9.4.2.1.2 Driver and Receiver Function Tables
          3. 9.4.2.1.3 CAN Bus States
  10. 10Application Information Disclaimer
    1. 10.1 Application Information
      1. 10.1.1 Typical Application
      2. 10.1.2 Design Requirements
        1. 10.1.2.1 Bus Loading, Length and Number of Nodes
      3. 10.1.3 Detailed Design Procedure
        1. 10.1.3.1 CAN Termination
      4. 10.1.4 Application Curves
      5. 10.1.5 Power Supply Recommendations
      6. 10.1.6 Layout
        1. 10.1.6.1 Layout Guidelines
        2. 10.1.6.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Documentation Support
    2. 11.2 ドキュメントの更新通知を受け取る方法
    3. 11.3 サポート・リソース
    4. 11.4 商標
    5. 11.5 静電気放電に関する注意事項
    6. 11.6 用語集
  12. 12Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

7.9 Timing Requirements

Over recommended operating conditions with TJ = -40°C to 150°C, unless otherwise noted. All typical values are taken at 25°C, VSUP = 12 V, VIO = 3.3 V, VCC = 5 V and RL = 60 Ω
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Supply Characteristics
tPWRUP Time required for INH active after VSUP ≥ UVSUP(R) See Figure 8-12   340 µs
tUV Undervoltage filter time VCC and VIO  (1) VCC ≤ UVCC or VIO ≤ UVIO 100 350 ms
tUV(RE-ENABLE) Re-enable time after undervoltage event (1) Time for device to return to normal operation from a UVCC or UVIO undervoltage event 200 µs
Device Characteristics
tPROP(LOOP1) Total loop delay, driver input (TXD) to receiver output (RXD) Recessive to dominant RL = 60 Ω, CL = 100 pF, CL(RXD) = 15 pF 
See Figure 8-6 		 100 190 ns
tPROP(LOOP2) Total loop delay, driver input (TXD) to receiver output (RXD) Dominant to recessive RL = 60 Ω, CL = 100 pF, CL(RXD) = 15 pF 
See Figure 8-6 		 110 190 ns
tWK(TIMEOUT) Bus wake-up timeout value (1) 0.8 2 ms
tWK(FILTER) Bus time to meet filtered bus requirements for wake-up request (1) 0.5 1.8 µs
tSILENCE Timeout for bus inactivity (1) Timer is reset and restarted, when bus changes from dominant to recessive or vice versa 0.6 1.2 s
tINACTIVE Standby mode hardware timer for power-up inactivity 3 4 5 min
tBIAS Bus bias reaction time (1) Measured from the start of a dominant-recessive-dominant sequence (each phase 6 μs) until VSYM ≥ 0.1 nSTB = EN = 0 V, RL = 60 Ω, CSPLIT = 4.7 nF
See Figure 8-9  and Figure 10-3 		 200 µs
tCBF Bus fault-detection time 45 ≤ RCM ≤ 70 Ω
CL = open		 2.5 µs
tWAKE_HT Hold time for which WAKE pin voltage should be stable after the rising or falling edge on WAKE pin to recognize LWU 5 50 µs
Mode Change Characteristics
tINH_SLP_STB Time after WUP or LWU event until INH asserted (1)   100 µs
tINH_MASK Hold time for which  INH_MASK should be stable after the rising or falling edge to enable/disable INH_MASK function
See Figure 8-10 and Figure 8-11 		 50 µs
tMODE1 Mode change time from leaving the Sleep mode to entering Normal or Silent mode (1) Time measured from VCC and VIO crossing UV thresholds to entering normal or silent mode. 20 µs
tMODE2 Mode change time between normal, silent and standby mode and from sleep to standby mode (1) Mode change time between normal, silent and standby mode and from sleep to standby mode 10 µs
tGOTOSLEEP Minimum hold time for transition to sleep mode (1) EN = H and nSTB = L 20 50 µs
(1) Specified by design and verified via bench characterization