7 Parameter Measurement Information

Note:

All TXD_INT, RXD_INT and EN_INT references are for internal nodes that represent the same functions for a physical layer transceiver. In test mode these can be brought out to pins to test the transceiver or CAN FD controller.

Figure 7-1 Bus States (Physical Bit Representation)

A: Selective Wake

B: Standby and Sleep Modes (Low Power)

Figure 7-2 Simplified Recessive Common Mode Bias Unit and Receiver

Figure 7-3 Supply Test Circuit

Figure 7-4 Driver Test Circuit and Measurement

Figure 7-5 Receiver Test Circuit and Measurement

Figure 7-6 Transmitter and Receiver Timing Behavior Test Circuit and Measurement

Figure 7-7 TXD_INT Dominant Timeout Test Circuit and Measurement

Figure 7-8 Driver Short-Circuit Current Test and Measurement

Figure 7-9 t_WAKE While Monitoring INH Output

Figure 7-10 Test Signal Definition for Bias Reaction Time Measurement

Figure 7-11 SPI AC Characteristic Write

Figure 7-12 SPI AC Characteristic Read

Figure 7-13 Power Up Timing

Figure 7-14 Sleep to Standby Timing

Figure 7-15 Normal to Sleep Timing

Figure 7-16 Normal to Standby Timing