JAJSHV6B August 2019 – June 2022 TLIN1028-Q1
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
RXD OUTPUT TERMINAL (OPEN-DRAIN) | ||||||
VOL | Output low voltage | Based upon a 2 kΩ to 10 kΩ external pull-up to VCC | 0.2 | VCC | ||
IOL | Low-level output current, open-drain | LIN = 0 V, RXD = 0.4 V | 1.5 | mA | ||
ILKG | Leakage current, high-level | LIN = VSUP, RXD = VCC | –5 | 0 | 5 | µA |
TXD INPUT TERMINAL | ||||||
VIL | Low-level input voltage | –0.3 | 0.8 | V | ||
VIH | High-level input voltage | 2 | 5.5 | V | ||
IIH | High-level input leakage current | TXD = high | –5 | 0 | 5 | µA |
RTXD | Internal pull-up resistor value | 125 | 350 | 800 | kΩ | |
LIN TERMINAL (REFERENCED TO VSUP) | ||||||
VOH | High-level output voltage(1) | LIN recessive, TXD = high, IO = 0 mA, VSUP = 5.5 V to 36 V | 0.85 | VSUP | ||
VOL | Low-level output voltage(1) | LIN dominant, TXD = low, VSUP = 5.5 V to 36 V | 0.2 | VSUP | ||
VIH | High-level input voltage(1) | LIN recessive, TXD = high, IO = 0 mA, VSUP = 5.5 V to 36 V | 0.47 | 0.6 | VSUP | |
VIL | Low-level input voltage(1) | LIN dominant, TXD = low, VSUP = 5.5 V to 36 V | 0.4 | 0.53 | VSUP | |
VSUP_NON_OP | VSUP where impact of recessive LIN bus < 5% (ISO/DIS 17987 Param 11) | TXD & RXD open, VLIN = 5.5 V to 42 V, Bus Load = 60 kΩ + diode and 1.1 kΩ + diode | –0.3 | 42 | V | |
I BUS_LIM | Limiting current (ISO/DIS 17987 Param 12) | TXD = 0 V, VLIN = 36 V, RMEAS = 440 Ω, VSUP = 36 V, VBUSdom < 4.518 V; Figure 8-6 |
40 | 90 | 200 | mA |
I BUS_PAS_dom | Receiver leakage current, dominant (ISO/DIS 17987 Param 13) | VLIN = 0 V, VSUP = 12 V Driver off/recessive, RMEAS = 499 Ω; Figure 8-7 | –1 | mA | ||
I BUS_PAS_rec1 | Receiver leakage current, recessive (ISO/DIS 17987 Param 14) | VLIN ≥ VSUP, 5.5 V ≤ VSUP ≤ 36 V Driver off, RMEAS = 1 kΩ; Figure 8-8 | 20 | µA | ||
I BUS_PAS_rec2 | Receiver leakage current, recessive (ISO/DIS 17987 Param 14) | VLIN = VSUP, Driver off, RMEAS = 1 kΩ; Figure 8-8 | –8 | 8 | µA | |
I BUS_NO_GND | Leakage current, loss of ground (ISO/DIS 17987 Param 15) | GND = VSUP, VSUP = 12 V, 0 V ≤ VLIN ≤ 28 V, RMEAS = 1 kΩ; Figure 8-9 | –1 | 1 | mA | |
IBUS_NO_BAT | Leakage current, loss of supply (ISO/DIS 17987 Param 16) | 0 V ≤ VLIN ≤ 28 V, VSUP = GND, RMEAS = 10 kΩ; Figure 8-10 | 8 | µA | ||
VBUSdom | Low-level input voltage (ISO/DIS 17987 Param 17) | LIN dominant (including LIN dominant for wake up); Figure 8-3, Figure 8-4 | 0.4 | VSUP | ||
VBUSrec | High-level input voltage (ISO/DIS 17987 Param 18) | LIN recessive; Figure 8-3, Figure 8-4 | 0.6 | VSUP | ||
VBUS_CNT | Receiver center threshold (ISO/DIS 17987 Param 19) | VBUS_CNT = (VIL + VIH)/2; Figure 8-3, Figure 8-4 | 0.475 | 0.5 | 0.525 | VSUP |
VHYS | Hysteresis voltage (ISO/DIS 17987 Param 20)(2) | VHYS = (VIL - VIH); Figure 8-3, Figure 8-4 | 0.07 | 0.175 | VSUP | |
VSERIAL_DIODE | Serial diode LIN term pull-up path (ISO/DIS 17987 Param 21) | By design and characterization | 0.4 | 0.7 | 1.0 | V |
RPU | Internal Pull-up resistor to VSUP (ISO/DIS 17987 Param 26) | Normal and Standby modes | 20 | 45 | 60 | kΩ |
IRSLEEP | Pull-up current source to VSUP | Sleep mode, VSUP = 12 V, LIN = GND | –20 | –2 | µA | |
CLINPIN | Capacitance of the LIN pin (6) | 25 | pF | |||
EN INPUT TERMINAL | ||||||
VIH | High-level input voltage | 2 | 5.5 | V | ||
VIL | Low-level input voltage | –0.3 | 0.8 | V | ||
VHYS | Hysteresis voltage | By design and characterization | 30 | 500 | mV | |
IIL | Low-level input current | EN = Low | –6 | 0 | 6 | µA |
REN | Internal pull-down resistor | 125 | 350 | 800 | kΩ | |
nRST TERMINAL (OPEN DRAIN OUTPUT) | ||||||
ILKG | Leakage current, high-level | LIN = VSUP, nRST = VCC | –6 | 6 | µA | |
VOL | Low-level output voltage | Based upon external pull up to VCC | 0.2 | VCC | ||
IOL | Low-level output current, open-drain | LIN = 0 V, nRST = 0.4 V | 1.5 | mA | ||
DUTY CYCLE CHARACTERISTICS | ||||||
D1 | Duty Cycle 1 (ISO/DIS 17987 Param 27 and J2602 Normal battery)(3)(4) | THREC(MAX) = 0.744 x VSUP, THDOM(MAX) = 0.581 x VSUP, VSUP = 7 V to 18 V, tBIT = 50/52 µs, D1 = tBUS_rec(min)/(2 x tBIT) (See Figure 8-11, Figure 8-12) |
0.396 | |||
D2 | Duty Cycle 2 (ISO/DIS 17987 Param 28 and J2602 Normal battery)(3)(4) | THREC(MIN) = 0.422 x VSUP, THDOM(MIN) = 0.284 x VSUP, VSUP = 7.6 V to 18 V, tBIT = 50/52 µs (20 kbps), D2 = tBUS_rec(MAX)/(2 x tBIT) (See Figure 8-11, Figure 8-12) |
0.581 | |||
D3 | Duty Cycle 3 (ISO/DIS 17987 Param 29 and J2602 Normal battery)(3)(4) | THREC(MAX) = 0.778 x VSUP, THDOM(MAX) = 0.616 x VSUP, VSUP = 7 V to 18 V, tBIT = 96 µs (10.4 kbps), D3 = tBUS_rec(min)/(2 x tBIT) (See Figure 8-11, Figure 8-12) |
0.417 | |||
D4 | Duty Cycle 4 (ISO/DIS 17987 Param 30 and J2602 Normal battery)(3)(4) | THREC(MIN) = 0.389 x VSUP, THDOM(MIN) = 0.251 x VSUP, VSUP = 7.6 V to 18 V, tBIT = 96 µs (10.4 kbps), D4 = tBUS_rec(MAX)/(2 x tBIT) (See Figure 8-11, Figure 8-12) |
0.59 | |||
D1LB | Duty Cycle 1 J2602 Low battery (4)(5) |
THREC(MAX) = 0.665 x VSUP, THDOM(MAX) = 0.499 x VSUP, VSUP = 5.5 V to 7 V, tBIT = 50/52 µs, D1LB = tBUS_rec(min)/(2 x tBIT) (See Figure 8-11, Figure 8-12) | 0.396 | |||
D2LB | Duty Cycle 2 J2602 Low battery (4)(5) |
T THREC(MIN) = 0.496 x VSUP, THDOM(MIN) = 0.361 x VSUP, VSUP = 6.1 V to 7.6 V, tBIT = 50/52 µs, D2LB = tBUS_rec(MAX)/(2 x tBIT) (See Figure 8-11, Figure 8-12) | 0.581 | |||
D3LB | Duty Cycle 3 J2602 Low battery (4)(5) |
THREC(MAX) = 0.665 x VSUP, THDOM(MAX) = 0.499 x VSUP, VSUP = 5.5 V to 7 V, tBIT = 96 µs, D3LB = tBUS_rec(min)/(2 x tBIT) (See Figure 8-11, Figure 8-12) | 0.417 | |||
D4LB | Duty Cycle 4 J2602 Low battery (4)(5) |
T THREC(MIN) = 0.496 x VSUP, THDOM(MIN) = 0.361 x VSUP, VSUP = 6.1 V to 7.6 V, tBIT = 96 µs, D4LB = tBUS_rec(MAX)/(2 x tBIT) (See Figure 8-11, Figure 8-12) | 0.59 |