SPRS357D August   2006  – June 2020 TMS320F28044

PRODUCTION DATA.  

  1. 1Device Overview
    1. 1.1 Features
    2. 1.2 Applications
    3. 1.3 Description
    4. 1.4 Functional Block Diagram
  2. 2Revision History
  3. 3Device Comparison
    1. 3.1 Related Products
  4. 4Terminal Configuration and Functions
    1. 4.1 Pin Diagrams
    2. 4.2 Signal Descriptions
  5. 5Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings – Commercial
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Power Consumption Summary
      1. Table 5-1 TMS320F28044 Current Consumption by Power-Supply Pins at 100-MHz SYSCLKOUT
      2. 5.4.1     Reducing Current Consumption
    5. 5.5  Electrical Characteristics
    6. 5.6  Thermal Resistance Characteristics for F28044 100-Ball GGM Package
    7. 5.7  Thermal Resistance Characteristics for F28044 100-Pin PZ Package
    8. 5.8  Thermal Design Considerations
    9. 5.9  Timing and Switching Characteristics
      1. 5.9.1 Timing Parameter Symbology
        1. 5.9.1.1 General Notes on Timing Parameters
        2. 5.9.1.2 Test Load Circuit
        3. 5.9.1.3 Device Clock Table
          1. Table 5-3 TMS320x280x Clock Table and Nomenclature
      2. 5.9.2 Power Sequencing
        1. 5.9.2.1   Power Management and Supervisory Circuit Solutions
        2. Table 5-5 Reset (XRS) Timing Requirements
      3. 5.9.3 Clock Requirements and Characteristics
        1. Table 5-6 Input Clock Frequency
        2. Table 5-7 XCLKIN Timing Requirements - PLL Enabled
        3. Table 5-8 XCLKIN Timing Requirements - PLL Disabled
        4. Table 5-9 XCLKOUT Switching Characteristics (PLL Bypassed or Enabled)
      4. 5.9.4 Peripherals
        1. 5.9.4.1 General-Purpose Input/Output (GPIO)
          1. 5.9.4.1.1 GPIO - Output Timing
            1. Table 5-10 General-Purpose Output Switching Characteristics
          2. 5.9.4.1.2 GPIO - Input Timing
            1. Table 5-11 General-Purpose Input Timing Requirements
          3. 5.9.4.1.3 Sampling Window Width for Input Signals
          4. 5.9.4.1.4 Low-Power Mode Wakeup Timing
            1. Table 5-12 IDLE Mode Timing Requirements
            2. Table 5-13 IDLE Mode Switching Characteristics
            3. Table 5-14 STANDBY Mode Timing Requirements
            4. Table 5-15 STANDBY Mode Switching Characteristics
            5. Table 5-16 HALT Mode Timing Requirements
            6. Table 5-17 HALT Mode Switching Characteristics
        2. 5.9.4.2 Enhanced Control Peripherals
          1. 5.9.4.2.1 Enhanced Pulse Width Modulator (ePWM) Timing
            1. Table 5-18 ePWM Timing Requirements
            2. Table 5-19 ePWM Switching Characteristics
          2. 5.9.4.2.2 Trip-Zone Input Timing
            1. Table 5-20 Trip-Zone input Timing Requirements
          3. 5.9.4.2.3 High-Resolution PWM Timing
            1. Table 5-21 High Resolution PWM Characteristics at SYSCLKOUT = (60 - 100 MHz)
          4. 5.9.4.2.4 ADC Start-of-Conversion Timing
            1. Table 5-22 External ADC Start-of-Conversion Switching Characteristics
        3. 5.9.4.3 External Interrupt Timing
          1. Table 5-23 External Interrupt Timing Requirements
          2. Table 5-24 External Interrupt Switching Characteristics
        4. 5.9.4.4 I2C Electrical Specification and Timing
          1. Table 5-25 I2C Timing
        5. 5.9.4.5 Serial Peripheral Interface (SPI) Master Mode Timing
          1. Table 5-26 SPI Master Mode External Timing (Clock Phase = 0)
          2. Table 5-27 SPI Master Mode External Timing (Clock Phase = 1)
        6. 5.9.4.6 SPI Slave Mode Timing
          1. Table 5-28 SPI Slave Mode External Timing (Clock Phase = 0)
          2. Table 5-29 SPI Slave Mode External Timing (Clock Phase = 1)
      5. 5.9.5 JTAG Debug Probe Connection Without Signal Buffering for the DSP
      6. 5.9.6 Flash Timing
        1. Table 5-30 Flash Endurance for A Temperature Material
        2. Table 5-31 Flash Parameters at 100-MHz SYSCLKOUT
        3. Table 5-32 Flash/OTP Access Timing
        4. Table 5-33 Flash Data Retention Duration
    10. 5.10 On-Chip Analog-to-Digital Converter
      1. Table 5-35 ADC Electrical Characteristics (over recommended operating conditions)
      2. 5.10.1     ADC Power-Up Control Bit Timing
        1. Table 5-36 ADC Power-Up Delays
        2. Table 5-37 Current Consumption for Different ADC Configurations (at 25-MHz ADCCLK)
      3. 5.10.2     Definitions
      4. 5.10.3     Sequential Sampling Mode (Single-Channel) (SMODE = 0)
        1. Table 5-38 Sequential Sampling Mode Timing
      5. 5.10.4     Simultaneous Sampling Mode (Dual-Channel) (SMODE = 1)
        1. Table 5-39 Simultaneous Sampling Mode Timing
      6. 5.10.5     Detailed Descriptions
  6. 6Detailed Description
    1. 6.1 Brief Descriptions
      1. 6.1.1  C28x CPU
      2. 6.1.2  Memory Bus (Harvard Bus Architecture)
      3. 6.1.3  Peripheral Bus
      4. 6.1.4  Real-Time JTAG and Analysis
      5. 6.1.5  Flash
      6. 6.1.6  M0, M1 SARAMs
      7. 6.1.7  L0, L1 SARAMs
      8. 6.1.8  Boot ROM
      9. 6.1.9  Security
      10. 6.1.10 Peripheral Interrupt Expansion (PIE) Block
      11. 6.1.11 External Interrupts (XINT1, XINT2, XNMI)
      12. 6.1.12 Oscillator and PLL
      13. 6.1.13 Watchdog
      14. 6.1.14 Peripheral Clocking
      15. 6.1.15 Low-Power Modes
      16. 6.1.16 Peripheral Frames 0, 1, 2 (PFn)
      17. 6.1.17 General-Purpose Input/Output (GPIO) Multiplexer
      18. 6.1.18 32-Bit CPU-Timers (0, 1, 2)
      19. 6.1.19 Control Peripherals
      20. 6.1.20 Serial Port Peripherals
    2. 6.2 Peripherals
      1. 6.2.1 32-Bit CPU-Timers 0/1/2
      2. 6.2.2 Enhanced PWM Modules (ePWM1–16)
      3. 6.2.3 Hi-Resolution PWM (HRPWM)
      4. 6.2.4 Enhanced Analog-to-Digital Converter (ADC) Module
        1. 6.2.4.1 ADC Connections if the ADC Is Not Used
        2. 6.2.4.2 ADC Registers
      5. 6.2.5 Serial Communications Interface (SCI) Module (SCI-A)
      6. 6.2.6 Serial Peripheral Interface (SPI) Module (SPI-A)
      7. 6.2.7 Inter-Integrated Circuit (I2C)
      8. 6.2.8 GPIO MUX
    3. 6.3 Memory Map
    4. 6.4 Register Map
      1. 6.4.1 Device Emulation Registers
    5. 6.5 Interrupts
      1. 6.5.1 External Interrupts
    6. 6.6 System Control
      1. 6.6.1 OSC and PLL Block
        1. 6.6.1.1 External Reference Oscillator Clock Option
        2. 6.6.1.2 PLL-Based Clock Module
        3. 6.6.1.3 Loss of Input Clock
      2. 6.6.2 Watchdog Block
    7. 6.7 Low-Power Modes Block
  7. 7Applications, Implementation, and Layout
    1. 7.1 TI Reference Design
  8. 8Device and Documentation Support
    1. 8.1 Getting Started
    2. 8.2 Device and Development Support Tool Nomenclature
    3. 8.3 Tools and Software
    4. 8.4 Documentation Support
    5. 8.5 Support Resources
    6. 8.6 Trademarks
    7. 8.7 Electrostatic Discharge Caution
    8. 8.8 Glossary
  9. 9Mechanical, Packaging, and Orderable Information
    1. 9.1 Packaging Information

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  • PZ|100
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発注情報

5.1 Absolute Maximum Ratings(1)(2)

Unless otherwise noted, the list of absolute maximum ratings are specified over operating temperature ranges.
MIN MAX UNIT
Supply voltage VDDIO, VDD3VFL with respect to VSS –0.3 4.6 V
VDDA2, VDDAIO with respect to VSSA –0.3 4.6
VDD with respect to VSS –0.3 2.5
VDD1A18, VDD2A18 with respect to VSSA –0.3 2.5
VSSA2, VSSAIO, VSS1AGND, VSS2AGND with respect to VSS –0.3 0.3
Input voltage VIN –0.3 4.6 V
Output voltage VO –0.3 4.6 V
Input clamp current IIK (VIN < 0 or VIN > VDDIO)(3) –20 20 mA
Output clamp current IOK (VO < 0 or VO > VDDIO) –20 20 mA
Operating ambient temperature, TA A version (GGM, PZ)(4) –40 85 °C
Junction temperature TJ(4) –40 150 °C
Storage temperature Tstg(4) –65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Section 5.3 is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to VSS, unless otherwise noted.
(3) Continuous clamp current per pin is ±2 mA. This includes the analog inputs which have an internal clamping circuit that clamps the voltage to a diode drop above VDDA2 or below VSSA2.
(4) Long-term high-temperature storage or extended use at maximum temperature conditions may result in a reduction of overall device life. For additional information, see Semiconductor and IC Package Thermal Metrics; Calculating Useful Lifetimes of Embedded Processors; and Calculating FIT for a Mission Profile.