SLVSDG4B March 2016 – August 2016 TPD1E04U04
PRODUCTION DATA.
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VALUE | UNIT | |||
---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) | ±2500 | V |
Charged-device model (CDM), per JEDEC specification JESD22-C101(2) | ±1000 |
VALUE | UNIT | |||
---|---|---|---|---|
V(ESD) | Electrostatic discharge | IEC 61000-4-2 contact discharge | ±16000 | V |
IEC 61000-4-2 air-gap discharge | ±16000 |
MIN | MAX | UNIT | ||
---|---|---|---|---|
VIO | Input pin voltage | 0 | 3.6 | V |
TA | Operating free-air temperature | –40 | 125 | °C |
THERMAL METRIC(1) | TPD1E04U04 | TPD1E04U04 | UNIT | |
---|---|---|---|---|
DPY (X1SON) | DPL (X2SON) | |||
2 PINS | 2 PINS | |||
RθJA | Junction-to-ambient thermal resistance | 683.6 | 574 | °C/W |
RθJC(top) | Junction-to-case (top) thermal resistance | 494.2 | 332.2 | °C/W |
RθJB | Junction-to-board thermal resistance | 568.7 | 237.6 | °C/W |
ψJT | Junction-to-top characterization parameter | 217.4 | 150.2 | °C/W |
ψJB | Junction-to-board characterization parameter | 568.7 | 238.2 | °C/W |
RθJC(bot) | Junction-to-case (bottom) thermal resistance | N/A | N/A | °C/W |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
VRWM | Reverse stand-off voltage | IIO < 10 nA | 3.6 | V | ||
VBR | Breakdown voltage, IO pin to GND | TA = 25°C(1) | 4.5 | 6.2 | 7.5 | V |
VF | Forward diode voltage, GND to IO pin | IIO = 1 mA, TA = 25°C | 0.8 | V | ||
VHOLD | Holding voltage | IIO = 1 mA | 5.3 | V | ||
VCLAMP | Clamping voltage | IPP = 1 A, TLP, from IO to GND | 5.3 | V | ||
IPP = 16 A, TLP, from IO to GND | 8.9 | |||||
IPP = 1 A, TLP, from GND to IO | 1.3 | |||||
IPP = 16 A, TLP, from GND to IO | 4.6 | |||||
ILEAK | Leakage current, any IO to GND | VIO = 2.5 V | 0.1 | 10 | nA | |
RDYN | Dynamic resistance | IO to GND | 0.25 | Ω | ||
GND to IO | 0.18 | |||||
CL | Line capacitance | VIO = 0 V, f = 1 MHz, IO to GND, TA = 25°C | 0.5 | 0.65 | pF |