6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted) (1)
|
|
MIN |
MAX |
UNIT |
VRWM |
Maximum voltage allowed from pin 1 to pin 2, or pin 2 to pin 1 |
–5 |
5 |
V |
IPP |
Peak pulse current (tp = 8/20 μs) |
|
3.8 |
A |
PPP |
Peak pulse power (tp = 8/20 μs) |
|
50 |
W |
TA |
Operating temperature |
–40 |
125 |
°C |
Tstg |
Storage temperature |
–65 |
155 |
°C |
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
6.2 ESD Ratings
|
VALUE |
UNIT |
V(ESD) |
Electrostatic discharge |
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) |
±2500 |
V |
Charged-device model (CDM), per JEDEC specification JESD22-C101(2) |
±1000 |
IEC 61000-4-2 contact discharge |
±15000 |
IEC 61000-4-2 air-gap discharge |
±15000 |
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. Pins listed as ±2500 V may actually have higher performance.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. Pins listed as ±1000 V may actually have higher performance.
6.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
|
MIN |
NOM |
MAX |
UNIT |
Operating free-air temperature, TA |
–40 |
|
125 |
°C |
Operating Voltage |
Pin 1 to 2 or Pin 2 to 1 |
–5 |
|
5 |
V |
6.4 Thermal Information
THERMAL METRIC(1) |
TPD1E6B06 |
UNIT |
DPL (X2SON) |
2 PINS |
RθJA |
Junction-to-ambient thermal resistance |
567.1 |
°C/W |
RθJC(top) |
Junction-to-case (top) thermal resistance |
253.2 |
°C/W |
RθJB |
Junction-to-board thermal resistance |
31.6 |
°C/W |
ψJT |
Junction-to-top characterization parameter |
379.1 |
°C/W |
ψJB |
Junction-to-board characterization parameter |
31.6 |
°C/W |
(1) For more information about traditional and new thermal metrics, see the
Semiconductor and IC Package Thermal Metrics application report,
SPRA953.
6.5 Electrical Characteristics
over operating free-air temperature range (unless otherwise noted)
PARAMETER |
TEST CONDITIONS |
MIN |
TYP |
MAX |
UNIT |
VRWM |
Reverse stand-off voltage |
ILEAK = 100 nA |
|
|
±5 |
V |
ILEAK |
Leakage current |
Pin 1 = 5 V, Pin 2 = 0 V |
|
|
100 |
nA |
VClamp1,2 |
Clamp voltage with ESD strike on pin 1, pin 2 grounded. |
IPP = 1 A, tp = 8/20 μs |
|
|
10 |
V |
IPP = 5 A, tp = 8/20 μs |
|
|
14 |
VClamp2,1 |
Clamp voltage with ESD strike on pin 2, pin 1 grounded. |
IPP = 1 A, tp = 8/20 μs |
|
|
10 |
V |
IPP = 5 A, tp = 8/20 μs |
|
|
14 |
RDYN |
Dynamic resistance |
Pin 1 to Pin 2(1) |
|
0.55 |
|
Ω |
Pin 2 to Pin 1(1) |
|
0.55 |
|
CIO |
I/O capacitance |
VIO = 2.5 V; ƒ = 1 MHz |
|
6 |
|
pF |
VBR1,2 |
Breakdown voltage, pin 1 to pin 2 |
IIO = 1 mA |
6 |
|
|
V |
VBR2,1 |
Breakdown voltage, pin 2 to pin 1 |
IIO = 1 mA |
6 |
|
|
V |
(1) Extraction of RDYN using least squares fit of TLP characteristics between IPP = 10 A and IPP = 20 A.
6.6 Typical Characteristics
Figure 1. ESD Clamp Voltage +8-kV Contact ESD
Figure 3. Clamping Voltage VTLP = F(ITLP), PIN1 to PIN2
Figure 5. IV Curve
Figure 2. ESD Clamp Voltage –8-kV Contact ESD
Figure 4. Clamping Voltage VTLP = F(ITLP), PIN2 to PIN1