JAJSHD7 May   2019 TPS2596

ADVANCE INFORMATION for pre-production products; subject to change without notice.  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
    1.     Device Images
      1.      概略回路図
      2.      TPS25963x の 1kV EFT 応答
  4. 4 改訂履歴
  5. 5 デバイス比較表
  6. 6 Pin Configuration and Functions
    1. Table 1. Pin Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Timing Requirements
    7. 7.7 Switching Characteristics
    8. 7.8 Typical Characteristics
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Feature Description
    3. 8.3 Functional Block Diagram
      1. 8.3.1 TPS25962x Block Diagram
      2. 8.3.2 TPS25963x Block Diagram
    4. 8.4 Feature Description
      1. 8.4.1 Undervoltage Protection (UVP) and Undervoltage Lockout (UVLO)
      2. 8.4.2 Overvoltage Protection
        1. 8.4.2.1 Overvoltage Lockout
        2. 8.4.2.2 Overvoltage Clamp
      3. 8.4.3 Inrush Current, Overcurrent and Short Circuit Protection
        1. 8.4.3.1 Slew Rate and Inrush Current Control (dVdt)
        2. 8.4.3.2 Active Current Limiting
        3. 8.4.3.3 Short Circuit Protection
      4. 8.4.4 Analog Load Current Monitor (IMON)
      5. 8.4.5 Overtemperature Protection (OTP)
      6. 8.4.6 Fault Indication
    5. 8.5 Device Functional Modes
      1. 8.5.1 Enable and Fault Pin Functional Mode 1: Single Device, Self-Controlled
      2. 8.5.2 Enable and Fault Pin Functional Mode 2: Single Device, Host-Controlled
      3. 8.5.3 Enable and Fault Pin Functional Mode 3: Multiple Devices, Self-Controlled
  9. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Precision Current Limiting and Protection for White Goods
      2. 9.2.2 Design Requirements
      3. 9.2.3 Detailed Design Procedure
        1. 9.2.3.1 Programming the Current-Limit Threshold: RILM Selection
        2. 9.2.3.2 Undervoltage and Overvoltage Lockout Set Point
        3. 9.2.3.3 Setting Output Voltage Ramp Time (TdVdT)
          1. 9.2.3.3.1 Case 1: Start-Up Without Load. Only Output Capacitance COUT Draws Current
          2. 9.2.3.3.2 Case 2: Start-Up With Load. Output Capacitance COUT and Load Draw Current
      4. 9.2.4 Support Component Selection: RFLT and CIN
      5. 9.2.5 Application Curves
    3. 9.3 System Examples
      1. 9.3.1 Current Limiting and Overvoltage Protection and for Energy Meter Power Rails
      2. 9.3.2 Precision Current Limiting and Protection in Appliances
  10. 10Power Supply Recommendations
    1. 10.1 Transient Protection
    2. 10.2 Output Short-Circuit Measurements
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12デバイスおよびドキュメントのサポート
    1. 12.1 ドキュメントのサポート
      1. 12.1.1 関連資料
    2. 12.2 ドキュメントの更新通知を受け取る方法
    3. 12.3 コミュニティ・リソース
    4. 12.4 商標
    5. 12.5 静電気放電に関する注意事項
    6. 12.6 Glossary
  13. 13メカニカル、パッケージ、および注文情報

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

7.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
PARAMETER PIN MIN MAX UNITS
VIN Maximum Input Voltage Range IN –0.3 21 V
Maximum Input Voltage Range (TA = 25 ℃) 22 V
VOUT Maximum Output Voltage Range OUT –0.3 min (21, VIN + 0.3) V
VEN/UVLO Maximum Enable Pin Voltage Range EN/UVLO –0.3 7 V
VOV Maximum OVCSEL/OVLO Pin Voltage Range OVCSEL/OVLO –0.3 7 V
VdVdT Maximum dVdT Pin Voltage Range DVDT 2.5 V
VFLTB Maximum FLTb Pin Voltage Range FLT –0.3 7 V
IMAX Maximum Continuous Switch Current IN to OUT Internally Limited A
TJ Junction temperature Internally Limited °C
TLEAD Maximum Lead Temperature 300 °C
Tstg Storage temperature –65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Rating may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Condition. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.