JAJSOA2 December   2022 TPS25961

PRODUCTION DATA  

  1. 特長
  2. アプリケーション
  3. 概要
  4. Revision History
  5. Pin Configuration and Functions
  6. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Timing Requirements
    7. 6.7 Switching Characteristics
    8. 6.8 代表的特性
  7. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 過電圧保護 (UVP) および低電圧ロックアウト (UVLO)
      2. 7.3.2 Overvoltage Protection
      3. 7.3.3 Inrush Current, Overcurrent and Short Circuit Protection
        1. 7.3.3.1 Slew Rate and Inrush Current Control (dVdt)
        2. 7.3.3.2 Active Current Limiting
        3. 7.3.3.3 Short-Circuit Protection
      4. 7.3.4 Overtemperature Protection (OTP)
      5. 7.3.5 Fault Response
    4. 7.4 Device Functional Modes
  8. Application and Implementation
    1. 8.1 Application Information
    2. 8.2 代表的なアプリケーション
      1. 8.2.1 Adapter input protection for set-top boxes
      2. 8.2.2 Design Requirements
      3. 8.2.3 Detailed Design Procedure
        1. 8.2.3.1 Programming the Current-Limit Threshold: RILM Selection
        2. 8.2.3.2 低電圧および過電圧ロックアウトの設定点
        3. 8.2.3.3 Output Voltage Rise Time (tR)
      4. 8.2.4 Application Curves
    3. 8.3 Application Example
      1. 8.3.1 Application Curves
    4. 8.4 Power Supply Recommendations
      1. 8.4.1 過渡保護
      2. 8.4.2 Output Short-Circuit Measurements
    5. 8.5 Layout
      1. 8.5.1 Layout Guidelines
      2. 8.5.2 Layout Example
  9. Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 ドキュメントの更新通知を受け取る方法
    3. 9.3 サポート・リソース
    4. 9.4 商標
    5. 9.5 静電気放電に関する注意事項
    6. 9.6 用語集
  10. 10Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ(パッケージ|ピン)
サーマルパッド・メカニカル・データ
発注情報

Layout Guidelines

  • For all applications, a ceramic decoupling capacitor of 0.1 μF or greater is recommended between the IN terminal and GND terminal. For hot-plug applications, where input power-path inductance is negligible, this capacitor can be eliminated or minimized.
  • The optimal placement of the decoupling capacitor is closest to the IN and GND terminals of the device. Care must be taken to minimize the loop area formed by the bypass-capacitor connection, the IN terminal, and the GND terminal of the IC.
  • High current-carrying power-path connections must be as short as possible and must be sized to carry at least twice the full-load current.
  • The GND terminal must be tied to the PCB ground plane at the terminal of the IC. The PCB ground must be a copper plane or island on the board.
  • Locate the following support components close to their connection pins:
    • RILIM
    • Resistor network for the EN/UVLO pin
    • Resistor network for the OVLO pin
    Connect the other end of the component to the GND pin of the device with shortest trace length. The trace routing from the components to the device pins must be as short as possible to reduce parasitic effects on the current limit and overvoltage response. These traces must not have any coupling to switching signals on the board.
  • Protection devices such as TVS, snubbers, capacitors, or diodes must be placed physically close to the device they are intended to protect. These protection devices must be routed with short traces to reduce inductance. For example, a protection Schottky diode is recommended to address negative transients due to switching of inductive loads, and it must be physically close to the OUT pins.
  • Obtaining acceptable performance with alternate layout schemes is possible. The example shown in Section 8.5.2 has been shown to produce good results and is intended as a guideline.