SNVSCN2 September   2024 TPS37100-Q1

ADVANCE INFORMATION  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Device Comparison
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Switching Characteristics
    7. 6.7 Timing Requirements
    8. 6.8 Timing Diagrams
    9. 6.9 Typical Characteristics
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Input Voltage (VDD)
        1. 7.3.1.1 Undervoltage Lockout (VPOR < VDD < UVLO)
        2. 7.3.1.2 Power-On Reset (VDD < VPOR )
      2. 7.3.2 SENSE
        1. 7.3.2.1 Adjustable Voltage Thresholds
        2. 7.3.2.2 SENSE Hysteresis
        3. 7.3.2.3 Reverse Polarity Protection
      3. 7.3.3 Output Logic Configurations
        1. 7.3.3.1 Open-Drain
        2. 7.3.3.2 Active-Low (OUT A and OUT B)
        3. 7.3.3.3 Latching
      4. 7.3.4 User-Programmable Release Time Delay
        1. 7.3.4.1 Deassertion Time Delay Configuration
      5. 7.3.5 User-Programmable Sense Delay
        1. 7.3.5.1 Sense Time Delay Configuration
      6. 7.3.6 Analog Out
      7. 7.3.7 Built-in Self-Test
        1. 7.3.7.1 Latching
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design 1: Off-Battery Monitoring
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
        3. 8.2.1.3 Application Curves
    3. 8.3 Power Supply Recommendations
      1. 8.3.1 Power Dissipation and Device Operation
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
      3. 8.4.3 Creepage Distance
  10. 9 Device and Documentation Support
    1. 9.1 Receiving Notification of Documentation Updates
    2. 9.2 Support Resources
    3. 9.3 Trademarks
    4. 9.4 Electrostatic Discharge Caution
    5. 9.5 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

7.3.7 Built-in Self-Test

The BIST feature is only in TPS37102-Q1 option only. TPS37100 does not have BIST.

The BIST sequence of internal tests verifies the health of the internal signal chain of the device by checking for faults on the internal comparators on the SENSE pin, bandgap voltage, and the OUT A and OUT B outputs.

The TPS37102-Q1 has a Built-In Self-Test (BIST) feature that runs diagnostics internally in the device to monitor the health of the device. During power-up BIST is initiated automatically after crossing VDD(min). During BIST the BIST pin and OUT A and OUT B output asserts low and deasserts if the BIST test completes successfully indicating no internal faults in the device. The length of the BIST and BIST assertion is specified by tBIST. If BIST is not successful, the BIST pin stays asserted low signifying an internal fault. The OUT A and OUT B output asserts on BIST failure. During BIST, the device is not monitoring the SENSE pin for faults and the OUT A and OUT B is not dependent on the SENSE pin voltage.

After a successful power-up sequence, BIST can be initiated any time with a rising edge input (VBIST_EN > 1.3V) on the BIST_EN pin. BIST initiates and the BIST pin asserts only if the SENSE pin is not in a overvoltage or undervoltage fault mode.