THERMAL METRIC(1) | TPS53511 | UNITS |
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QFN (RGT) |
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16 PINS |
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θJA | Junction-to-ambient thermal resistance(2) | 45.3 | °C/W |
θJCtop | Junction-to-case (top) thermal resistance(3) | 57.3 |
θJB | Junction-to-board thermal resistance(4) | 18.4 |
ψJT | Junction-to-top characterization parameter(5) | 1.1 |
ψJB | Junction-to-board characterization parameter(6) | 18.4 |
θJCbot | Junction-to-case (bottom) thermal resistance(7) | 3.9 |
(1) For more information about traditional and new thermal metrics, see the
Semiconductor and IC Package Thermal Metrics application report (
SPRA953).
(2) The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as specified in JESD51-7, in an environment described in JESD51-2a.
(3) The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDEC-standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
(4) The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB temperature, as described in JESD51-8.
(5) The junction-to-top characterization parameter, ψJT, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining RθJA, using a procedure described in JESD51-2a (sections 6 and 7).
(6) The junction-to-board characterization parameter, ψJB, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining RθJA, using a procedure described in JESD51-2a (sections 6 and 7).
(7) The junction-to-case (bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.