SUPPLY CURRENT |
VCC, AVCC |
Supply voltage |
During normal operation |
3.7 |
|
6 |
V |
During programming (writing) of OTP memory |
-5% |
5 |
+5% |
V |
IQ |
Operating quiescent current |
LDO1 disabled LDO2 disabled No I2C communications LED_EN = 0 CLKout_EN = 0 24MHz crystal disabled |
|
25 |
30 |
μA |
LDO1 disabled LDO2 enabled, IOUT(LDO2) = 0 mA No I2C communications LED_EN = 0 CLKout_EN = 0 24MHz crystal disabled |
|
40 |
55 |
uA |
LDO1 enabled, IOUT(LDO1) = 0 mA LDO2 disabled No I2C communications LED_EN = 0 CLKout_EN = 0 24MHz crystal disabled |
|
40 |
55 |
μA |
LDO1 enabled, IOUT(LDO1) = 0 mA LDO2 enabled, IOUT(LDO2) = 0 mA No I2C communications LED_EN = 0 CLKout_EN = 0 24MHz crystal disabled |
|
60 |
80 |
μA |
LDO1 enabled, IOUT(LDO1) = 0 mA LDO2 enabled, IOUT(LDO2) = 0 mA No I2C communications LED_EN = 0 CLKout_EN = 1 24MHz crystal enabled |
|
2900 |
3550 |
μA |
LDO1 enabled, IOUT(LDO1) = 0 mA LDO2 enabled, IOUT(LDO2) = 0 mA No I2C communications LED_EN = 1, PWM Duty Cycle set to 99.9%, ISINK = 2mA CLKout_EN = 1 24MHz crystal enabled |
|
3000 |
3600 |
μA |
ISD |
Shutdown current |
Device disabled; VCC and AVCC < 1.8V |
|
45 |
85 |
μA |
LED_ENABLE |
VIH |
High level input voltage |
|
1.1 |
|
VCC |
V |
VIL |
Low level input voltage |
|
|
|
0.4 |
V |
I(in)lkg |
Input Leakage Current |
|
|
|
0.1 |
μA |
|
Input Deglitch |
With a minimum pulse period of 500ns before another glitch is received |
|
|
100 |
ns |
GENERAL PURPOSE INPUT/OUTPUT (GPIO) |
VIH |
High level input voltage |
For VLDO1 = 1.8V |
1.1 |
|
VLDO1 |
V |
VIH |
High level input voltage |
For VLDO1 = 3.3V |
1.37 |
|
VLDO1 |
V |
VIL |
Low level input voltage |
For VLDO1 = 1.8V |
0 |
|
0.4 |
V |
VIL |
Low level input voltage |
For VLDO1 = 3.3V |
0 |
|
0.6 |
V |
I(in)lkg |
Input leakage current |
GPIO programmed as input and tied to GND or VCC |
|
0.01 |
0.1 |
μA |
VOH |
High level output voltage |
Configured as a push-pull output, IOH = 1mA, VLDO1 ≥ 1.8V |
1.2 |
VLDO1-0.2V |
VLDO1 |
V |
VOH |
High level output voltage |
Configured as a push-pull output, IOH = 1mA, 1.3V ≤ VLDO1 ≤1.8V |
1.0 |
|
VLDO1 |
V |
VOL |
Low level output voltage |
Configured as a push-pull output, IOL= 2mA, VLDO1 ≥ 1.8V |
|
|
0.25 |
V |
VOL |
Low level output voltage |
Configured as a push-pull output, IOL= 2mA, 1.3V ≤ VLDO1 ≤1.8V |
|
|
0.3 |
V |
VOL |
Low level output voltage |
Configured as an open-drain output, IOL= 4mA, VLDO1 ≥ 1.8V |
|
|
0.6 |
V |
VOL |
Low level output voltage |
Configured as an open-drain output, IOL= 2mA, 1.3V ≤ VLDO1 ≤1.8V |
|
|
0.6 |
V |
I(out)lkg |
Output leakage current |
Configured as an open-drain output, GPIO connected to VLDO1 |
|
0.01 |
0.1 |
μA |
GENERAL PURPOSE OUTPUT (GPO) |
VOH |
High level output voltage |
Configured as a push-pull output, IOH = 1mA, VLDO1 ≥ 1.8V |
1.2 |
VLDO1-0.2V |
VLDO1 |
V |
VOH |
High level output voltage |
Configured as a push-pull output, IOH = 1mA, 1.3V ≤ VLDO1 ≤ 1.8V |
1.0 |
|
VLDO1 |
V |
VOL |
Low level output voltage |
Configured as a push-pull output, IOL= 2mA, VLDO1 ≥ 1.8V |
|
|
0.25 |
V |
VOL |
Low level output voltage |
Configured as a push-pull output, IOL= 2mA, 1.3V ≤ VLDO1 ≤ 1.8V |
|
|
0.3 |
V |
VOL |
Low level output voltage |
Configured as an open-drain output, IOL= 4mA, VLDO1 ≥ 1.8V |
|
|
0.6 |
V |
VOL |
Low level output voltage |
Configured as an open-drain output, IOL= 2mA, 1.3V ≤ VLDO1 ≤1.8V |
|
|
0.6 |
V |
I(out)lkg |
Output leakage current |
Configured as an open-drain output, GPO connected to VLDO1 |
|
0.01 |
0.1 |
μA |
SCL, SDA |
|
|
|
|
|
VIH |
High level input voltage on SCL, SDA |
|
1.2 |
|
Vcc |
V |
VIL |
Low level input voltage on SCL, SDA |
|
0 |
|
0.4 |
V |
Ilkg |
Pin leakage current on SCL, SDA (includes leakage current for the open-drain output) |
Input at VIL or VIH |
|
|
100 |
nA |
VOL |
Low level output voltage on SDA |
For IOL= 1mA |
|
|
0.25 |
V |
UNDERVOLTAGE LOCKOUT (UVLO), SENSED AT PIN AVCC |
UVLO |
Internal undervoltage lockout threshold |
AVCC rising |
3.4 |
3.6 |
3.7 |
V |
Internal undervoltage lockout threshold hysteresis |
AVCC falling |
|
130 |
|
mV |
CLOCK GENERATOR |
fosc |
Frequency of external crystal |
|
|
24 |
|
MHz |
fCLKOUT |
Frequency on pin CLKOUT |
For OSC_FREQ[1,0] = 00 |
|
24 |
|
MHz |
For OSC_FREQ[1,0] = 01 |
|
12 |
|
For OSC_FREQ[1,0] = 10 |
|
6 |
|
For OSC_FREQ[1,0] = 11 |
|
3 |
|
|
Period jitter; rms |
Measured period compared to the Average Period of 10,000 randomly selected cylces |
|
|
600 |
ps |
|
Peak period to period jitter |
Measured period compared to the Average Period of 10,000 randomly selected cylces |
|
|
600 |
ps |
|
Duty cycle of CLKout |
|
40% |
50% |
60% |
|
|
Rise time / fall time for clock output |
10% to 90% of output voltage, 1.3V ≤ VLDO1 ≤ 3.3V |
|
|
10 |
ns |
|
Load capacitance |
Defines the maximum capacitance that can be driven by the CLKOUT buffer and still meet the specified rise/fall times |
|
|
15 |
pF |
|
Output impedance |
|
|
50 |
|
Ω |
VOH |
High level output voltage |
Internally connected to VLDO1≥ 1.8V: for COUT = 15pF, IOH = 1mA |
1.6 |
VLDO1
- 0.2V |
VLDO1 |
V |
VOL |
Low level output voltage |
For COUT = 15pF, IOL = 1mA |
|
0.2 |
0.3 |
V |
tstart |
Oscillator start-up time |
Time from CLKout_EN=1 to CLKout active for the NXTBD-24.000M crystal, not tested in production but based on simulations |
|
|
10 |
ms |
THERMAL PROTECTION |
TSD |
Thermal shutdown |
Increasing junction temperature |
|
150 |
|
°C |
|
Thermal shutdown hysteresis |
Decreasing junction temperature |
|
30 |
|
°C |
VLDO1, VLDO2 LOW DROPOUT REGULATORS |
VCC |
Input voltage range for LDO1 and LDO2 |
|
3.7 |
|
6 |
V |
VLDO1 |
LDO1 output voltage |
See LDO1_CTRL Register definition for all available voltage settings. |
0.8 |
1.8 |
3.3 |
V |
VLDO2 |
LDO2 output voltage |
See LDO2_CTRL Register definition for all available voltage settings. |
0.8 |
1.2 |
3.3 |
V |
IO |
Output current for LDO1 and LDO2 |
|
|
|
100 |
mA |
ISC |
LDO1 and LDO2 short circuit current limit |
VLDOx = GND |
110 |
|
220 |
mA |
|
Dropout voltage at LDO1 and LDO2 |
IO = 75mA; VCC ≥ 3.7V |
|
|
700 |
mV |
|
Output voltage accuracy for LDO1 and LDO2 |
VCC = VLDO + 0.6V (min 3.7V) to 6V, IO = 2mA through 75mA T = 0°C to 85°C |
–1.5% |
|
1.5% |
|
|
Load Transient |
VCC=AVCC=5V, IO(LDOx)= 0A to 75mA in 1us |
|
|
10% |
|
PSRR |
Power supply rejection ratio |
f = 10kHz, COUT ≥ 2.2μF VINLDOx = 5V, VOUT = 1.8V, IOUT = 75mA, |
|
56 |
|
dB |
|
Output voltage rms noise |
Voltage ripple and noise from 10kHz to 5MHz; Normal mode |
|
|
4 |
mV |
tRamp |
VOUT ramp time |
Time to ramp from 5% to 95% of VOUT |
24 |
50 |
200 |
µs |
RDIS |
Internal discharge resistor at VLDO1 and VLDO2 |
VIN < UVLO |
200 |
400 |
550 |
Ω |
LED CURRENT SINK |
ILED |
Isink current (LED current for 99.9% duty cycle) |
|
|
10 |
|
mA |
|
Minimum voltage drop from ISINK to GND needed for proper regulation |
At ISINK = 10mA |
0.3 |
|
|
V |
|
ISINK accuracy |
ISINK = 10mA, Duty Cycle set to 99.9% |
–10% |
|
5% |
V |
|
PWM frequency seetings |
For PWM_FREQ[1,0] = 00 |
|
23.5 |
|
kHz |
For PWM_FREQ[1,0] = 01 |
|
11.7 |
|
For PWM_FREQ[1,0] = 10 |
|
5.8 |
|
For PWM_FREQ[1,0] = 11 |
|
2.9 |
|
|
PWM duty cycle range |
Limited by ISINK rise / fall time for PWM_FREQ[1:0] other than 2'b11 setting |
0% |
|
99.9% |
|
|
ISINK rise / fall time |
V(ISINK) ≥ 0.6V for 2mA ≤ ISINK ≤ 30mA |
|
400 |
|
ns |