SLVSCJ5C December 2015 – September 2024 TPS7H3301-SP
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||||
---|---|---|---|---|---|---|---|---|---|
SUPPLY CURRENT | |||||||||
IVDD/Vin | Supply current | EN = 3.3 V, no load | 18 | 30 | mA | ||||
IVDD(SDN) | Shutdown current | EN = 0 V, VDDQSNS = 0, no load | 3 | 5 | mA | ||||
EN = 0 V, VDDQSNS > 0.78 V, no load | 6.5 | 8 | |||||||
IVLDOIN | Supply current of VLDOIN | EN = 3.3 V, no load | 575 | 1200 | μA | ||||
IVLDOIN(SDN) | Shutdown current of VLDOIN | EN = 0 V, no load | 50 | 100 | μA | ||||
INPUT CURRENT | |||||||||
IVDDQSNS | Input current, VDDQSNS | EN = 3.3 V | 4 | 6 | μA | ||||
VTT/VO OUTPUT | |||||||||
VTTSNS | Output DC voltage, VTT/VO | IVTT = 5 mA | VDDQSNS = VLDOIN 2.5 V (DDR1) | 1.219 | 1.25 | 1.276 | V | ||
VDDQSNS = VLDOIN 1.8 V (DDR2) | 0.889 | 0.9 | 0.921 | ||||||
VDDQSNS = VLDOIN 1.5 V (DDR3) | 0.743 | 0.75 | 0.769 | ||||||
VDDQSNS = VLDOIN 1.35 V (DDR3L) | 0.668 | 0.67 | 0.691 | ||||||
VDDQSNS = VLDOIN 1.2 V (DDR4) | 0.593 | 0.6 | 0.617 | ||||||
IVTT = -5 mA | VDDQSNS = VLDOIN 2.5 V (DDR1) | 1.22 | 1.25 | 1.272 | V | ||||
VDDQSNS = VLDOIN 1.8 V (DDR2) | 0.89 | 0.9 | 0.923 | ||||||
VDDQSNS = VLDOIN 1.5 V (DDR3) | 0.744 | 0.75 | 0.767 | ||||||
VDDQSNS = VLDOIN 1.35 V (DDR3L) | 0.669 | 0.675 | 0.691 | ||||||
VDDQSNS = VLDOIN 1.2 V (DDR4) | 0.594 | 0.6 | 0.616 | ||||||
-1 A ≤ IVTT ≤1 A | VDDQSNS = VLDOIN 2.5 V (DDR1) | 1.219 | 1.26 | 1.301 | V | ||||
VDDQSNS = VLDOIN 1.8 V (DDR2) | 0.879 | 0.91 | 0.933 | ||||||
VDDQSNS = VLDOIN 1.5 V (DDR3) | 0.734 | 0.76 | 0.781 | ||||||
VDDQSNS = VLDOIN 1.35 V (DDR3L) | 0.655 | 0.69 | 0.708 | ||||||
VDDQSNS = VLDOIN 1.2 V (DDR4) | 0.58 | 0.6 | 0.633 | ||||||
VDO |
Dropout voltage, VDO = VLDOIN - VTTREF. VDO recorded when VTTREF - VTT = 50 mV |
VDDQSNS = 2.5 V (DDR1) | IVTT = 0.5 A | 50 | 230 | mV | |||
IVTT = 1 A | 101 | 300 | |||||||
IVTT = 2 A | 209 | 400 | |||||||
VDDQSNS = 1.8 V (DDR2) | IVTT = 0.5 A | 54 | 230 | ||||||
IVTT = 1 A | 108 | 300 | |||||||
IVTT = 2 A | 228 | 400 | |||||||
VDDQSNS = 1.5 V (DDR3) | IVTT = 0.5 A | 52 | 230 | ||||||
IVTT = 1 A | 104 | 300 | |||||||
IVTT = 2 A | 216 | 400 | |||||||
VDDQSNS = 1.35 V (DDR3) | IVTT = 0.5 A | 50 | 230 | ||||||
IVTT = 1 A | 102 | 300 | |||||||
IVTT = 2 A | 212 | 400 | |||||||
VDDQSNS = 1.2 V (DDR4) | IVTT = 0.5 A | 50 | 230 | ||||||
IVTT = 1 A | 102 | 300 | |||||||
IVTT = 2 A | 210 | 400 | |||||||
VTT/VO(TOL) | Output voltage tolerance to VTTREF | IVTT/VO = –3 A, across VDD/VIN voltage range | 12 | 25 | 34 | mV | |||
IVTT/VO = 3 A, across VDD/VIN voltage range | –34 | –25 | –12 | ||||||
IVOSRCL | VTT/VO source current limit | Ramp output 0 A to 10 A, record current when VTT reaches lowest value | 3.25 | 8 | A | ||||
IVOSNCL | VTT/VO/VTT sink current limit | Ramp output 0 A to -10 A, record current when VTT reaches highest value | 3.5 | 10 | A | ||||
RDSCHRG | Discharge impedance | VDDQSNS = 0 V, VTT/VO = 0.3 V, EN = 0 V | 18 | 25 | Ω | ||||
POWER-GOOD COMPARATOR | |||||||||
VTH(PG) | VTT/VO PGOOD threshold | PGOOD window lower (falling) threshold with respect to VVTTREF | –23.5% | –20% | –17.5% | ||||
PGOOD window upper (rising) threshold with respect to VVTTREF | 17.5% | 20% | 23.5% | ||||||
PGOOD hysteresis | 5% | ||||||||
TPGSTUPDLY | PGOOD start up delay | Start up rising edge, VTTSNS within 15% of VVTTREF | 2 | ms | |||||
VPGOODLOW | Output low voltage | ISINK = 4 mA | 0.4 | V | |||||
TPBADDLY | PGOOD bad delay | VTTSNS is outside of the ±20% PGOOD window | 1 | μs | |||||
IPGOODLK | Leakage current | VTTSNS = VTTREF (PGOOD high impedance), PGOOD = VDD/VIN + 0.2 V |
1 | μA | |||||
VDDQSNS AND VTTREF OUTPUT | |||||||||
VVDDQSNS_UVLO | VDDQSNS undervoltage lockout | VDDQSNS rising | 780 | mV | |||||
VVDDQSNSUVHYS | VDDQSNS undervoltage lockout hysteresis | 20 | mV | ||||||
VVTTREF | VTTREF voltage | VDDQSNS / 2 | V | ||||||
VTTREF(load_reg) | Load reg ΔVTTREF | –10 mA < IVTTREF < 10 mA | VDDQSNS = 2.5 V | –15 | 15 | mV | |||
VDDQSNS = 1.8 V | –15 | 15 | |||||||
VDDQSNS = 1.5 V | –15 | 15 | |||||||
VDDQSNS = 1.35 V | –15 | 15 | |||||||
VDDQSNS = 1.2 V | –15 | 15 | |||||||
VTTREFaccuracy | VTTREF voltage tolerance to VDDQSNS | –10 mA < IVTTREF < 10 mA | VDDQSNS = 2.5 V | 49% | 51% | ||||
VDDQSNS = 1.8 V | 49% | 51% | |||||||
VDDQSNS = 1.5 V | 49% | 51.25% | |||||||
VDDQSNS = 1.35 V | 49% | 51.5% | |||||||
VDDQSNS = 1.2 V | 49% | 51.5% | |||||||
–3 mA < IVTTREF < 3 mA | VDDQSNS = 1.5 V | 49% | 51% | ||||||
VDDQSNS = 1.35 V | 49% | 51% | |||||||
VDDQSNS = 1.2 V | 49% | 51% | |||||||
IVTTREFSRCL | VVTTREF source current limit | Sourcing current ramped from 0 A to 55 mA. Find when VTTREF drops to half of its original value. | 10 | 40 | mA | ||||
IVTTREFSNCCL | VVTTREF sink current limit | Sinking current ramped from 0 A to 16.5 mA. Find when VTTREF hits peak value. | 12 | 15 | mA | ||||
IVTTREFDIS | VTTREF discharge current | EN = 0 V, VDDQSNS = 0 V, VTTREF = 0.5 V | 1.3 | mA | |||||
UVLO/EN LOGIC THRESHOLD | |||||||||
VVINUVVIN | UVLO threshold | Wakeup | 2.18 | 2.25 | V | ||||
VVINUVVINHYS | UVLO threshold hysteresis | Hysteresis | 50 | mV | |||||
VENIH | High-level input voltage | Enable | 1.7 | V | |||||
VENIL | Low-level input voltage | Enable | 0.3 | V | |||||
VENYST | Hysteresis voltage | Enable | 0.5 | V | |||||
IENLEAK | Logic input leakage current | EN | –1 | 1 | μA | ||||
THERMAL SHUTDOWN | |||||||||
TSON | Thermal shutdown threshold | Shutdown temperature | 210 | °C | |||||
Hysteresis | 12 |