JAJSGT5M November   2006  – November 2024 TS3USB221

PRODUCTION DATA  

  1.   1
  2. 1 特長
  3. 2 アプリケーション
  4. 3 概要
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information
    5. 5.5  Electrical Characteristics
    6. 5.6  Dynamic Electrical Characteristics, VCC = 3.3V ± 10%
    7. 5.7  Dynamic Electrical Characteristics, VCC = 2.5V ± 10%
    8. 5.8  Switching Characteristics, VCC = 3.3V ± 10%
    9. 5.9  Switching Characteristics, VCC = 2.5V ± 10%
    10. 5.10 Typical Characteristics
  7. 6 Parameter Measurement Information
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Low Power Mode
    4. 7.4 Device Functional Modes
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curves
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 ドキュメントの更新通知を受け取る方法
    3. 9.3 サポート・リソース
    4. 9.4 Trademarks
    5. 9.5 静電気放電に関する注意事項
    6. 9.6 用語集
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

5.4 Thermal Information

THERMAL METRIC(1) TS3USB221 UNIT
DRC (VSON) RSE (UQFN)
10 PINS 10 PINS
RθJA Junction-to-ambient thermal resistance 57.7 204.8 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 87.7 118.1
RθJB Junction-to-board thermal resistance 32.6 121.5
ψJT Junction-to-top characterization parameter 8.2 13.9
ψJB Junction-to-board characterization parameter 32.8 121.2
RθJC(bot) Junction-to-case (bottom) thermal resistance 18.5 N/A
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application note.