JAJSQP2D february   2013  – july 2023 TUSB8040A1

PRODUCTION DATA  

  1.   1
  2. 1特長
  3. 2アプリケーション
  4. 3概要
  5. 4Revision History
  6. 5Pin Configuration and Functions
  7. 6Specifications
    1. 6.1 Absolute Maximum Ratings #GUID-9FC00080-214A-41B8-A47D-B9F7BA87DE22/SLLSE42922
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 3.3-V I/O Electrical Characteristics
    6. 6.6 Hub Input Supply Current
    7. 6.7 Timing and Switching Characteristics
      1. 6.7.1 Clock Generation
      2. 6.7.2 Crystal Requirements
      3. 6.7.3 Input Clock Requirements
  8. 7Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Memory
    4. 7.4 I2C EEPROM Operation
    5. 7.5 SMBus Target Operation
    6. 7.6 Configuration Registers
      1. 7.6.1  ROM Signature Register
      2. 7.6.2  Vendor ID LSB Register
      3. 7.6.3  Vendor ID MSB Register
      4. 7.6.4  Product ID LSB Register
      5. 7.6.5  Product ID MSB Register
      6. 7.6.6  Device Configuration Register
      7. 7.6.7  Battery Charging Support Register
      8. 7.6.8  Device Removable Configuration Register
      9. 7.6.9  Port Used Configuration Register
      10. 7.6.10 Reserved Register
      11. 7.6.11 Reserved Register
      12. 7.6.12 Language ID LSB Register
      13. 7.6.13 Language ID MSB Register
      14. 7.6.14 Serial Number String Length Register
      15. 7.6.15 Manufacturer String Length Register
      16. 7.6.16 Product String Length Register
      17. 7.6.17 Reserved Register
      18. 7.6.18 Serial Number Registers
      19. 7.6.19 Manufacturer String Registers
      20. 7.6.20 Product String Registers
      21. 7.6.21 Additional Feature Configuration Register
      22. 7.6.22 Reserved Register
      23. 7.6.23 Reserved Register
      24. 7.6.24 Device Status and Command Register
  9. 8Applications, Implementation, and Layout
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1 Upstream Port Implementation
        2. 8.2.2.2 Downstream Port 1 Implementation
        3. 8.2.2.3 Downstream Port 2 Implementation
        4. 8.2.2.4 Downstream Port 3 Implementation
        5. 8.2.2.5 Downstream Port 4 Implementation
        6. 8.2.2.6 VBUS Power Switch Implementation
        7. 8.2.2.7 Clock, Reset, I2C/SMBUS, and Misc
        8. 8.2.2.8 Power Implementation
      3. 8.2.3 Application Curve
      4. 8.2.4 Power Supply Recommendations
        1. 8.2.4.1 Power Up and Reset
      5. 8.2.5 Layout
        1. 8.2.5.1 Layout Guidelines
          1. 8.2.5.1.1 Part Placement
          2. 8.2.5.1.2 Board Layout Considerations
            1. 8.2.5.1.2.1  RKM Package – QFN (Quad Flat No-Lead)
            2. 8.2.5.1.2.2  Impedance
            3. 8.2.5.1.2.3  Critical Signals
            4. 8.2.5.1.2.4  Crystal
            5. 8.2.5.1.2.5  USB Interface
            6. 8.2.5.1.2.6  Differential Pair Signals
              1. 8.2.5.1.2.6.1 Internal Bond Wire Mismatch
            7. 8.2.5.1.2.7  Port Connectors
            8. 8.2.5.1.2.8  Reset Terminals
            9. 8.2.5.1.2.9  Miscellaneous Terminals
            10. 8.2.5.1.2.10 Power Control and Battery Charging Terminals
            11. 8.2.5.1.2.11 USB 2.0 Port Indicator LED Terminals
          3. 8.2.5.1.3 Power
            1. 8.2.5.1.3.1 Power
            2. 8.2.5.1.3.2 Downstream Port Power
            3. 8.2.5.1.3.3 Ground
        2. 8.2.5.2 Layout Example
  10. 9Device and Documentation Support
    1. 9.1 ドキュメントの更新通知を受け取る方法
    2. 9.2 サポート・リソース
    3. 9.3 Trademarks
    4. 9.4 静電気放電に関する注意事項
    5. 9.5 用語集
  11.   Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報
8.2.5.1.2.7 Port Connectors

Most TUSB8040A1 customers will use thru-hole USB 3.0 standard connectors with mounting pegs soldered into the board for more rigid connections. The thru-hole connectors allow differential pairs to be routed on the bottom layer of the EVM without requiring any vias to the top layer at the connector. Routing on the bottom layer of the EVM to the thru-hole connector can reduce the stub length caused by the thru-hole pins.

The outside shield of the connector should be tied to chassis ground to provide a low impedance path to the chassis ground for ESD current. If galvanic isolation is required, the outside shield should be isolated from digital ground with a parallel combination of a 1-MΩ resistor and capacitors of 0.1 μF and 0.001 μF. Pins 4 and 7 of the USB 3.0 connector should be connected to digital ground. Both of these pins should be connected directly to the board ground plane as close to the connector as possible.