JAJSTC9A December   2023  – March 2024 UCC57108-Q1

ADVMIX  

  1.   1
  2. 1 特長
  3. 2 アプリケーション
  4. 3 概要
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Thermal Information
    4. 5.4 Recommended Operating Conditions
    5. 5.5 Electrical Characteristics
    6. 5.6 Switching Characteristics
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Input Stage
      2. 6.3.2 Enable Function
      3. 6.3.3 Driver Stage
      4. 6.3.4 Desaturation (DESAT) Protection
      5. 6.3.5 Fault (FLT)
    4. 6.4 Device Functional Modes
  8. 7  Applications and Implementation
    1. 7.1 Application Information
    2. 7.2 Typical Application
      1. 7.2.1 Design Requirements
      2. 7.2.2 Detailed Design Procedure
        1. 7.2.2.1 VDD Undervoltage Lockout
      3. 7.2.3 Application Curves
  9. 8 Power Supply Recommendations
  10. 9 Layout
    1. 9.1 Layout Guidelines
    2. 9.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 サード・パーティ製品に関する免責事項
    2. 10.2 サポート・リソース
    3. 10.3 Trademarks
    4. 10.4 静電気放電に関する注意事項
    5. 10.5 用語集
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information

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発注情報

5.1 Absolute Maximum Ratings

All the voltages are with respect to GND. Over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
VDD-GND Positive power supply –0.3 30 V
VDD-VEE Differential Power Supply -0.3 30 V
VEE-GND  Negative Power Supply -18 0.3 V
OUT Output signal DC voltage GND/VEE–0.3                 VDD+0.3 V
Output signal transient voltage for 200-ns GND/VEE–2                VDD+3 V
VDESAT Desat voltage –0.3            VDD+0.3 V
VIN IN signal DC voltage –5 30 V
VEN EN signal DC voltage (W Version) –5 30 V
IFLT FLT current sink 20 mA
VFLT External pull-up  -0.3 VDD+0.3 V
TJ Junction temperature –40 150 ℃
Tstg Storage temperature –65 150 ℃
(1) Stresses beyond those listed under Absolute Maximum Rating may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Condition. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.