JAJSLS2D march 2013 – april 2021 UCD3138064
PRODUCTION DATA
PARAMETER | TEST CONDITION | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
SUPPLY CURRENT | ||||||
I33A | Measured on V33A. The device is powered up but all ADC12 and EADC sampling is disabled | 6.3 | mA | |||
I33DIO | All GPIO and communication pins are open | 0.35 | mA | |||
I33D | ROM program execution | 60 | mA | |||
I33D (5) | Flash programming in ROM mode | 70 | mA | |||
I33 | The device is in ROM mode with all DPWMs enabled and switching at 2 MHz. The DPWMs are all unloaded. | 100 | mA | |||
ERROR ADC INPUTS EAP, EAN | ||||||
EAP – AGND | –0.15 | 1.998 | V | |||
EAP – EAN | –0.256 | 1.848 | V | |||
Typical error range | AFE = 0 | –256 | 248 | mV | ||
EAP – EAN Error voltage digital resolution | AFE = 3 | 0.8 | 1 | 1.20 | mV | |
AFE = 2 | 1.7 | 2 | 2.30 | mV | ||
AFE = 1 | 3.55 | 4 | 4.45 | mV | ||
AFE = 0 | 6.90 | 8 | 9.10 | mV | ||
REA | Input impedance (See Figure 9-1) | AGND reference | 0.5 | MΩ | ||
IOFFSET | Input offset current (See Figure 9-1) | –5 | 5 | μA | ||
EADC Offset | Input voltage = 0 V at AFE = 0 | –2 | 2 | LSB | ||
Input voltage = 0 V at AFE = 1 | –2.5 | 2.5 | LSB | |||
Input voltage = 0 V at AFE = 2 | –3 | -3 | LSB | |||
Input voltage = 0 V at AFE = 3 | –4 | 4 | LSB | |||
Sample Rate | 15.625 | MHz | ||||
Analog Front End Amplifier Bandwidth | 100 | MHz | ||||
A0 | Gain | See Figure 9-2 | 1 | V/V | ||
Minimum output voltage | 21 | mV | ||||
EADC DAC | ||||||
DAC range | 0 | 1.6 | V | |||
VREF DAC reference resolution | 10-bit, No dithering enabled | 1.56 | mV | |||
VREF DAC reference resolution | With 4-bit dithering enabled | 97.6 | μV | |||
INL | –2.0 | 2.0 | LSB | |||
DNL | Does not include MSB transition | –1.0 | 2.1 | LSB | ||
DNL at MSB transition | –1.4 | LSB | ||||
DAC reference voltage | 1.58 | 1.61 | V | |||
ADC12 | ||||||
IBIAS | Bias current for PMBus address pins | 9.5 | 10.5 | μA | ||
Measurement range for voltage monitoring | 0 | 2.5 | V | |||
Internal ADC reference voltage | –40 to 125 °C | 2.475 | 2.500 | 2.53 | V | |
Change in Internal ADC reference from 25°C reference voltage (5) | –40 to 25 °C | –0.7 | mV | |||
25 to 125 °C | –2.1 | |||||
ADC12 INL integral nonlinearity (5) | ADC_SAMPLING_SEL = 6 for all ADC12 data, 25 to 125 °C | –7.5/+2.9 | LSB | |||
ADC12 DNL differential nonlinearity (5) | –0.7/+3.2 | LSB | ||||
ADC Zero Scale Error | –7 | 7 | mV | |||
ADC Full Scale Error | –35 | 35 | mV | |||
Input bias | 2.5 V applied to pin | 200 | nA | |||
Input leakage resistance (5) | ADC_SAMPLING_SEL= 6 or 0 | 1 | MΩ | |||
Input Capacitance (5) | 10 | pF | ||||
DIGITAL INPUTS/OUTPUTS(1)(2) | ||||||
VOL | Low-level output voltage(3) | IOH = 4 mA, V33DIO = 3 V | DGND + 0.25 | V | ||
VOH | High-level output voltage (3) | IOH = –4 mA, V33DIO = 3 V | V33DIO – 0.6 | V | ||
VIH | High-level input voltage | V33DIO = 3 V | 2.1 | V | ||
VIL | Low-level input voltage | V33DIO = 3 V | 1.1 | V | ||
IOH | Output sinking current | 4 | mA | |||
IOL | Output sourcing current | –4 | mA | |||
SYSTEM PERFORMANCE | ||||||
TWD | Watchdog time out resolution | Total time is: TWD x (WDCTRL.PERIOD+1) | 13.1 | 17 | 22.7 | ms |
Processor master clock (MCLK) | 31.25 | MHz | ||||
tDelay | Digital filter delay(4) | (1 clock = 32 ns) | 6 | MCLKs | ||
Retention period of flash content (data retention and program) | TJ = 25 °C | 100 | years | |||
f(PCLK) | Internal oscillator frequency | 240 | 250 | 260 | MHz | |
Flash Read | 1 | MCLKs | ||||
ISHARE | Current share current source (See Section 9.3.15) | 238 | 259 | μA | ||
RSHARE | Current share resistor (See Section 9.3.15) | 9.75 | 10.3 | kΩ | ||
POWER ON RESET AND BROWN OUT (V33A pin, See Figure 8-3) | ||||||
VGH | Voltage Good High | 2.7 | V | |||
VGL | Voltage Good Low | 2.5 | V | |||
Vres | Voltage at which IReset signal is valid(5) | 0.8 | V | |||
Brownout | Internal signal warning of brownout conditions | 2.9 | V | |||
TEMPERATURE SENSOR(5) | ||||||
VTEMP | Voltage range of sensor | 1.46 | 2.44 | V | ||
Voltage resolution | Volts/°C | 5.9 | mV/°C | |||
Temperature resolution | Degree C per bit | 0.1034 | °C/LSB | |||
Accuracy(5)(6) | –40 to 125 °C | –10 | ±5 | 10 | °C | |
Temperature range | –40 to 125 °C | –40 | 125 | °C | ||
ITEMP | Current draw of sensor when active | 30 | μA | |||
VAMB | Ambient temperature | Trimmed 25 °C reading | 1.85 | V | ||
ANALOG COMPARATOR | ||||||
DAC | Reference DAC Range | 0 | 2.5 | V | ||
Reference Voltage | 2.478 | 2.5 | 2.513 | V | ||
Bits | 7 | bits | ||||
INL(5) | –0.42 | 0.21 | LSB | |||
DNL(5) | 0.06 | 0.12 | LSB | |||
Offset | –5.5 | 19.5 | mV | |||
Reference DAC buffered output load(7) | –0.5 | 1 | mA | |||
Buffer offset (–0.5 mA) | 4.6 | 8.3 | mV | |||
Buffer offset (1.0 mA) | –0.05 | 17 | mV | |||
Output Range (–0.5 mA) | 0.2 | 2.5 | V | |||
Output Range (1.0 mA) | 0 | 2.5 | V |