over operating free-air temperature range (unless otherwise
noted)The following specifications apply after calibration for
VA = VDR = VTC = VE = 1.9 V;
I and Q channels AC-coupled, FSR pin = High; CL = 10 pF;
differential AC-coupled sine wave input clock, fCLK = 1.6 GHz at
0.5 VP-P with 50% duty cycle; VBG = floating;
non-extended control mode; Rext = Rtrim = 3300 Ω ±0.1%; analog signal source
impedance = 100-Ω differential; 1:2 demultiplex non-DES mode; I and Q
channels; duty-cycle stabilizer on.(1)(2)
PARAMETER |
TEST CONDITIONS |
SUB-GROUPS |
MIN |
NOM(2) |
MAX |
UNIT |
fSCLK (max) |
Maximum serial clock frequency |
See(3) |
|
15 |
|
|
MHz |
fSCLK (min) |
Minimum serial clock frequency |
See(3) |
|
|
|
0 |
MHz |
|
Serial clock low time |
|
[9, 10, 11] |
30 |
|
|
ns |
|
Serial clock high time |
|
[9, 10, 11] |
30 |
|
|
ns |
tSSU |
Serial data to serial clock rising setup time |
See(3) |
|
2.5 |
|
|
ns |
tSH |
Serial data to serial clock rising hold time |
See(3) |
|
1 |
|
|
ns |
tSCS |
SCS to serial clock rising setup
time |
|
|
|
2.5 |
|
ns |
tHCS |
SCS to serial clock falling hold
time |
|
|
|
1.5 |
|
ns |
tBSU |
Bus turnaround time |
|
|
|
10 |
|
ns |
(1) The analog inputs are protected as shown below. Input voltage
magnitudes beyond the
Section 6.1 may damage this device.
(2) Typical figures are at TA = 25°C, and represent most
likely parametric norms. Test limits are ensured to Texas Instrument's average
outgoing quality level (AOQL).
(3) This parameter is specified by design and/or characterization
and is not tested in production.