JAJSFZ6F May 2013 – August 2018 TS3DV642
PRODUCTION DATA.
PARAMETER | TEST CONDITIONS(1) | MIN | TYP(2) | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
PORT A | |||||||
RON | ON-state resistance | D0 to D3 | VCC = 3 V, 1.5 V ≤ VI/O ≤ VCC,
II/O = –40 mA |
6.5 | 9.5 | Ω | |
SCL, SDA, HPD, CEC | 6 | 9.5 | Ω | ||||
RON(flat)(3) | ON-state resistance flatness | All I/O | VCC = 3 V, VI/O = 1.5 V and VCC,
II/O = –40 mA |
1.5 | Ω | ||
ΔRON(4) | On-state resistance match between high-speed channels | D0 to D3 | VCC = 3 V, 1.5 V ≤ VI/O ≤ VCC,
II/O = –40 mA |
0.4 | 1 | Ω | |
IOFF | Leakage under power off | All outputs | VCC = 0 V, VI/O = 0 to 3.6 V,
VIN = 0 V to 5.5 V |
±10 | µA | ||
PORT B | |||||||
RON | ON-state resistance | D0 to D3 | VCC = 3 V, 1.5 V ≤ VI/O ≤ VCC,
II/O = –40 mA |
8.2 | 10.5 | Ω | |
SCL, SDA, HPD, CEC | 6 | 9.5 | Ω | ||||
RON(flat)(3) | ON-state resistance flatness | All I/O | VCC = 3 V, VI/O = 1.5 V and VCC,
II/O = –40 mA |
1.5 | Ω | ||
ΔRON(4) | On-state resistance match between high-speed channels | D0 to D3 | VCC = 3 V, 1.5 V ≤ VI/O ≤ VCC,
II/O = –40 mA |
0.4 | 1 | Ω | |
IOFF | Leakage under power off | All outputs | VCC = 0 V, VI/O = 0 V to 3.6 V,
VIN = V to 5.5 V |
±10 | µA | ||
DIGITAL INPUTS (SEL1, SEL2, EN) | |||||||
VIH | High-level control input voltage | SEL1, SEL2, EN | 1.4 | V | |||
VIL | Low-level control input voltage | SEL1, SEL2, EN | 0.5 | V | |||
IIH | Digital input high leakage current | SEL1, SEL2, EN | VCC = 3.6 V , VIN = VDD | ±10 | µA | ||
IIL | Digital input low leakage current | SEL1, SEL2, EN | VCC = 3.6 V, VIN = GND | ±10 | µA | ||
SUPPLY | |||||||
ICC | VCC supply current | VCC = 3.6 V, II/O = 0, Normal Operation Mode, EN = H | 50 | µA | |||
ICC, PD | VCC supply current in power-down mode | VCC = 3.6 V, II/O = 0, EN = L | 6 | µA |