JAJSHU7D August   2019  – April 2021 THS6222

PRODUCTION DATA  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics: VS = 12 V
    6. 6.6 Electrical Characteristics: VS = 32 V
    7. 6.7 Timing Requirements
    8. 6.8 Typical Characteristics: VS = 12 V
    9. 6.9 Typical Characteristics: VS = 32 V
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Common-Mode Buffer
      2. 7.3.2 Thermal Protection and Package Power Dissipation
      3. 7.3.3 Output Voltage and Current Drive
      4. 7.3.4 Breakdown Supply Voltage
      5. 7.3.5 Surge Test Results
    4. 7.4 Device Functional Modes
  8. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Applications
      1. 8.2.1 Broadband PLC Line Driving
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
        3. 8.2.1.3 Application Curve
    3. 8.3 What to Do and What Not to Do
      1. 8.3.1 Do
      2. 8.3.2 Do Not
  9. 9 Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Wafer and Die Information
    3. 10.3 Layout Examples
  11. 11Device and Documentation Support
    1. 11.1 Development Support
    2. 11.2 Documentation Support
      1. 11.2.1 Related Documentation
    3. 11.3 Receiving Notification of Documentation Updates
    4. 11.4 サポート・リソース
    5. 11.5 Trademarks
    6. 11.6 Electrostatic Discharge Caution
    7. 11.7 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

7.3.4 Breakdown Supply Voltage

To estimate the margin beyond the maximum supply voltage specified in the Absolute Maximum Ratings table and exercise the robustness of the device, several typical units were tested beyond the specifications in the Absolute Maximum Ratings table. Figure 7-5 shows the configuration used for the test. The supply voltage, VS, was swept manually and quiescent current was recorded at each 0.5-V supply voltage increment. Figure 7-6 shows the results of the single-supply voltage where the typical units started breaking. Under a similar configuration as the one shown in Figure 7-5, a unit was subjected to VS = 42 V for 168 hours and tested for quiescent current at the beginning and at the end of the test. There was no notable difference in the quiescent current before and after the 168 hours of testing and the device did not show any signs of damage or abnormality.

The primary objective of these tests was to estimate the margins of robustness for typical devices and does not imply performance or maximum limits beyond those specified in the Abolute Maximum Ratings and Recommended Operating Conditions tables.

GUID-9A09DFDE-B1F7-4937-A6F7-242C44DBED35-low.gif Figure 7-5 Breakdown Supply Voltage Test Configuration
GUID-06DEC24E-7D14-4C9B-B002-09D5908CFFBF-low.gif Figure 7-6 Typical Device Breakdown Supply Voltage (TA = 27°C)