JAJSK66A March 2021 – March 2022 TPS2521
PRODUCTION DATA
The following table summarizes the device response to various fault conditions.
Event |
Protection Response |
Fault Latched Internally |
---|---|---|
Overtemperature | Shutdown |
Y |
Undervoltage (UVP or UVLO) | Shutdown |
N |
Input Reverse Polarity | Shutdown |
N |
Input Overvoltage | Voltage Clamp |
N |
Transient Overcurrent (ILIM < IOUT < 2 × ILIM) | None |
N |
Persistent Overcurrent | Current Limit |
N |
Output Short-Circuit to GND | Fast-trip followed by Current Limit |
N |
ILM Pin Open (During Steady State) | Shutdown |
N |
ILM Pin Shorted to GND | Shutdown |
Y |
Reverse Current ((VOUT – VIN) > VREVTH) | Reverse Current Blocking |
N |
Faults which are latched internally can be cleared either by power cycling the part (pulling VIN to 0 V) or by pulling the EN/UVLO pin voltage below VSD. This also resets the tRST timer for the TPS2521xA (auto-retry) variants.
During a latched fault, pulling the EN/UVLO just below the UVLO threshold has no impact on the device. This is true for both TPS2521xL (latch-off) and TPS2521xA (auto-retry) variants.
For TPS2521xA (auto-retry) variant, on expiry of the tRSTtimer after a fault, the device restarts automatically.