JAJSK66A March   2021  – March 2022 TPS2521

PRODUCTION DATA  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
  4. 4 Revision History
  5. 5 Device Comparison Table
  6. 6 Pin Configuration and Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Timing Requirements
    7. 7.7 Switching Characteristics
      1.      15
    8. 7.8 Typical Characteristics
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Input Reverse Polarity Protection
      2. 8.3.2 Undervoltage Lockout (UVLO and UVP)
      3. 8.3.3 Overvoltage Clamp (OVC)
      4. 8.3.4 Inrush Current, Overcurrent, and Short Circuit Protection
        1. 8.3.4.1 Slew Rate (dVdt) and Inrush Current Control
        2. 8.3.4.2 Active Current Limiting
        3. 8.3.4.3 Short-Circuit Protection
      5. 8.3.5 Analog Load Current Monitor
      6. 8.3.6 Reverse Current Protection
      7. 8.3.7 Overtemperature Protection (OTP)
      8. 8.3.8 Fault Response
      9. 8.3.9 Power Good Indication (PG)
    4. 8.4 Device Functional Modes
  9. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Single Device, Self-Controlled
    3. 9.3 Typical Application
      1. 9.3.1 Application
      2. 9.3.2 Design Requirements
      3. 9.3.3 Detailed Design Procedure
        1. 9.3.3.1 Device Selection
        2. 9.3.3.2 Setting Undervoltage and Overvoltage Thresholds
        3. 9.3.3.3 Setting Output Voltage Rise Time (tR)
        4. 9.3.3.4 Setting Power Good Assertion Threshold
        5. 9.3.3.5 Setting Overcurrent Threshold (ILIM)
        6. 9.3.3.6 Setting Overcurrent Blanking Interval (tITIMER)
      4. 9.3.4 Application Curves
  10. 10Power Supply Recommendations
    1. 10.1 Transient Protection
    2. 10.2 Output Short-Circuit Measurements
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Documentation Support
      1. 12.1.1 Related Documentation
    2. 12.2 Receiving Notification of Documentation Updates
    3. 12.3 サポート・リソース
    4. 12.4 Trademarks
    5. 12.5 Electrostatic Discharge Caution
    6. 12.6 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

10.2 Output Short-Circuit Measurements

Obtain repeatable and similar short-circuit testing results is difficult. The following contribute to variation in results:

  • Source bypassing
  • Input leads
  • Circuit layout
  • Component selection
  • Output shorting method
  • Relative location of the short
  • Instrumentation

The actual short exhibits a certain degree of randomness because it microscopically bounces and arcs. Ensure that configuration and methods are used to obtain realistic results. Do not expect to see waveforms exactly like those in this data sheet because every setup is different.