JAJSS08C April   2003  – October 2024 CD74AC174

PRODUCTION DATA  

  1.   1
  2. 1 特長
  3. 2 アプリケーション
  4. 3 概要
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information
    5. 5.5  Electrical Characteristics
    6. 5.6  Timing Requirements, VCC = 1.5 V
    7. 5.7  Timing Requirements, VCC = 3.3 V ± 0.3 V
    8. 5.8  Timing Requirements, VCC = 5 V ± 0.5 V
    9. 5.9  Switching Characteristics, VCC = 1.5 V
    10. 5.10 Switching Characteristics, VCC = 3.3 V ± 0.3 V
    11. 5.11 Switching Characteristics, VCC = 5 V ± 0.5 V
    12. 5.12 Operating Characteristics
  7. 6 Parameter Measurement Information
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Device Functional Modes
  9. 8 Application and Implementation
    1. 8.1 Power Supply Recommendations
    2. 8.2 Layout
      1. 8.2.1 Layout Guidelines
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support (Analog)
      1. 9.1.1 Related Documentation
    2. 9.2 ドキュメントの更新通知を受け取る方法
    3. 9.3 サポート・リソース
    4. 9.4 Trademarks
    5. 9.5 静電気放電に関する注意事項
    6. 9.6 用語集
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

5.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
VCC Supply voltage range –0.5 6 V
IIK Input clamp current (VI < 0 V or VI > VCC)(2) ±20 mA
IOK Output clamp current (VO < 0 V or VO > VCC)(2) ±50 mA
IO Continuous output current (VO> 0 V or VO < VCC) ±50 mA
Continuous current through VCC or GND ±150 mA
Tstg Storage temperature range –65 150 °C
(1) Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The input and output voltage ratings may be exceeded if the input and output current ratings are observed.