SBOK061 October   2022 SN54SLC8T245-SEP

 

  1.   SN54SLC8T245-SEP Single-Event Effects (SEE)
  2.   Trademarks
  3. 1Overview
  4. 2SEE Mechanisms
  5. 3Test Device and Test Board Information
  6. 4Irradiation Facility and Setup
  7. 5Results
    1. 5.1 Single Event Latchup (SEL) Results
    2. 5.2 Single Event Transient (SET) Results
    3. 5.3 Event Rate Calculations
  8. 6Summary
  9.   A References

3 Test Device and Test Board Information

The SN54SLC8T245-SEP is packaged in a 24-pin, TSSOP. Figure 3-1 shows the SN54SLC8T245-SEP pinout diagram and the package with the cap removed to reveal the die face for all heavy ion testing. Figure 3-2 and Figure 3-2 show the SN54SLC8T245-SEP bias diagrams.

GUID-10840135-01AD-465E-8A9B-44E642359D88-low.gifFigure 3-1 SN54SLC8T245-SEP Photograph and Pinout Diagram
Figure 3-2 SN54SLC8T245-SEP SEL Bias Diagram
Figure 3-3 SN54SLC8T245-SEP SET Bias Diagram