SBOK061 October   2022 SN54SLC8T245-SEP

 

  1.   SN54SLC8T245-SEP Single-Event Effects (SEE)
  2.   Trademarks
  3. 1Overview
  4. 2SEE Mechanisms
  5. 3Test Device and Test Board Information
  6. 4Irradiation Facility and Setup
  7. 5Results
    1. 5.1 Single Event Latchup (SEL) Results
    2. 5.2 Single Event Transient (SET) Results
    3. 5.3 Event Rate Calculations
  8. 6Summary
  9.   A References

1 Overview

The SN54SLC8T245-SEP device is an 8-bit noninverting bus transceiver that resolves voltage level mismatch between devices operating at the latest voltage nodes (0.7 V, 0.8 V, and 0.9 V) and devices operating at industry standard voltage nodes (1.8 V, 2.5 V, and 3.3 V). The device operates by using two independent power supply rails (VCCA and VCCB) that operate as low as 0.65 V. Data pins A1 through A8 are designed to track VCCA, which accepts any supply voltage from 0.65 V to 3.6 V. Data pins B1 through B8 are designed to track VCCB, which accepts any supply voltage from 0.65 V to 3.6 V.

Table 1-1 Overview Information(1)
DESCRIPTION DEVICE INFORMATION
TI Part Number

SN54SLC8T245-SEP
MLS Number

SN54SLC8T245PWTSEP
Device Function Radiation tolerant 8-bit dual-supply bus transceiver with configurable voltage translation
Technology

LBC7
Exposure Facility Radiation Effects Facility, Cyclotron Institute,
Texas A&M University
Heavy Ion Fluence per Run 1×106 – 1×107 ions/cm2
Irradiation Temperature 125°C (for SEL testing)
(1) TI may provide technical, applications or design advice, quality characterization, and reliability data or service, providing these items shall not expand or otherwise affect TI's warranties as set forth in the Texas Instruments Incorporated Standard Terms and Conditions of Sale for Semiconductor Products and no obligation or liability shall arise from Semiconductor Products and no obligation or liability shall arise from TI's provision of such items.