SBOK064 October   2022 SN54SLC8T245-SEP

 

  1.   SN54SLC8T245-SEP Radiation Tolerant 8-Bit Dual-Supply Bus Transceiver Voltage Translation TID Report
  2.   Trademarks
  3. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  4. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Biased
    4. 2.4 Test Configuration and Condition
  5. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Specification Compliance Matrix
  6. 4Reference Documents
  7.   A Appendix: HDR TID Report Data

1 SN54SLC8T245-SEP Radiation Tolerant 8-Bit Dual-Supply Bus Transceiver Voltage Translation TID Report

This report covers the radiation characterization results of the SN54SLC8T245-SEP 8-Bit Dual-Supply Bus Transceiver. The study was done to determine Total Ionizing Dose (TID) effects under high dose rate (HDR) up to 20 krad(Si) as a one time characterization. The results show that all samples passed within the specified limits up to 20 krad(Si). However, Radiation Lot Acceptance Testing (RLAT) will be performed using 34 units at a dose level of 20 krad(Si) for future wafer lots. Furthermore, the SN54SLC8T245-SEP is packaged in a space enhanced plastic for low outgassing characteristics and is Single Event Latch-Up (SEL) immune up to 43 MeV-cm2/mg making the device suitable for low Earth orbit space applications. The device is ideal for logic level shifting from low voltage FPGAs, controllers, and subsystems.