SBOK083A August   2024  – October 2024 TMUX582F-SEP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 Single-Event Latch-Up (SEL) Results
    2. 5.2 Event Rate Calculations
    3. 5.3 Single-Event Transients (SET) Results
  9. 6Summary
  10. 7References
  11. 8Revision History

Abstract

The purpose of this study is to characterize the single-event-effects (SEE) performance due to heavy ion irradiation of the TMUX582F-SEP, latch-up immune 8:1 multiplexer with adjustable fault thresholds. Heavy-ions with an LETEFF of 43MeV-cm2/mg were used to irradiate six production devices. Flux of ~105 ions / cm2 *s and fluence of ~107 ions / cm2 per run were used for the single-event latch-up (SEL) characterization and flux of ~104 ions / cm2 *s and fluence of ~106 ions / cm2 per run were used for the single-event transients (SET) characterization. The results demonstrate that the TMUX582F-SEP is SEL-free up to LETEFF = 43MeV-cm2/ mg at 125°C. Additionally, the single-event transient (SET) performance for output voltage excursions ≥ |10%| from the nominal voltage are discussed.