During SEL characterization, the device was heated using forced hot air, maintaining device temperature at 125°C ± 5°C. A FLIR (FLIR ONE Pro LT) thermal camera was used to validate die temperature to make sure the device was being accurately heated (see Figure 3-7). The species used for SEL testing was a silver (¹⁰⁹Ag) ion at an energy of 15MeV/µ with an angle-of-incidence of 0° for an LET_EFF of 43MeV-cm²/ mg. A fluence of approximately 1 × 10⁷ ions / cm² were used for the runs.

The three devices were powered up and exposed to the heavy-ions using the maximum recommended operating conditions under multiple bias schemes using two National Instruments PXI Chassis PXIe-4139 channels and a Keysight 33600A Waveform Generator for Bias #1, and three National Instruments PXI Chassis PXIe-4139 channels for Bias #2 and #3. The run duration to achieve this fluence was approximately one to two minutes. As listed in Table 5-6, no SEL events were observed during the 15 runs, indicating that the TMUX582F-SEP is SEL-free. Figure 5-1 and Figure 5-2 show the plot of current versus time for runs number 4, 9, 14 and 15, respectively.

No SEL events were observed, indicating that the TMUX582F-SEP is SEL-immune at LET_EFF = 43MeV-cm²/ mg and T = 125°C. The upper-bound cross-section (using a 95% confidence level) is calculated as: