SBOK083A August   2024  – October 2024 TMUX582F-SEP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 Single-Event Latch-Up (SEL) Results
    2. 5.2 Event Rate Calculations
    3. 5.3 Single-Event Transients (SET) Results
  9. 6Summary
  10. 7References
  11. 8Revision History

5.2 Event Rate Calculations

Event rates were calculated for LEO (ISS) and GEO environments by combining CREME96 orbital integral flux estimations and simplified SEE cross-sections according to methods described in Heavy Ion Orbital Environment Single-Event Effects Estimations. A minimum shielding configuration of 100mils (2.54mm) of aluminum and worst-week solar activity is assumed. (This is similar to a 99% upper bound for the environment). Table 5-2 lists the event rate calculations using the 95% upper-bounds for the SEL. It is important to note that this number is for reference since no SEL events were observed.
Table 5-2 SEL Event Rate Calculations for Worst-Week LEO and GEO Orbits
Orbit TypeOnset LET (MeV–cm2 / mg)CREME96 Integral Flux ( / day–cm2)σSAT (cm2)Event Rate ( / day)Event Rate (FIT)MTBE (years)
LEO(ISS)436.40 × 10-41.23 × 10-77.87 × 10-113.28 × 10-33.48 × 107
GEO2.17 × 10-32.67 × 10-101.11 × 10-21.03 × 107

MTBE is the mean-time-between-events in years at the given event rates. These rates clearly demonstrate the SEE robustness of the TMUX582F-SEP in two harshly conservative space environments. Customers using the TMUX582F-SEP must only use the above estimations as a rough guide and TI recommends performing event rate calculations based on specific mission orbital and shielding parameters to determine if the product satisfies the reliability requirements for the specific mission.