SBOK083A August   2024  – October 2024 TMUX582F-SEP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 Single-Event Latch-Up (SEL) Results
    2. 5.2 Event Rate Calculations
    3. 5.3 Single-Event Transients (SET) Results
  9. 6Summary
  10. 7References
  11. 8Revision History

1 Overview

The TMUX582F-SEP device is a modern 8:1 multiplexer designed for both single-ended and differential operation. This latch-up immune device offers robust overvoltage protection up to +60V making the device designed for harsh space environments. Additionally, this protection operates in powered-on, powered-off, and floating supply conditions.

See the product page for more information.

Table 1-1 Overview Information1
DescriptionDevice Information
TI Part NumberTMUX582F-SEP
MLS NumberTMUX582FPWTSEP
Device FunctionLatch-up immune 8:1 multiplexer with adjustable fault thresholds
TechnologyLBCSOI2
Exposure FacilityRadiation Effects Facility, Cyclotron Institute, Texas A&M University (15MeV/nucleon)
Heavy Ion Fluence per Run1×107 ions/cm2 And 1×106 ions/cm2
Irradiation Temperature125°C (for SEL testing)

And 25°C (for SET testing)

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