SFFS180 December 2021 SN65HVD1781A-Q1
This section provides Functional Safety Failure In Time (FIT) rates for SN65HVD1781A-Q1 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) 8-pin SOIC (D) JEDEC high-K model | FIT (Failures Per 109 Hours) 8-pin SOIC (D) JEDEC low-K model |
---|---|---|
Total Component FIT Rate | 19 | 12 |
Die FIT Rate | 10 | 4 |
Package FIT Rate | 9 | 8 |
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS, BICMOS Digital analog / mixed | 25 FIT | 55°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.