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This document contains information for PCA9306-Q1 (VSSOP package) to aid in a functional safety system design. Information provided are:
Figure 1-1 shows the device functional block diagram for reference.
PCA9306-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.
This section provides Functional Safety Failure In Time (FIT) rates for PCA9306-Q1 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total Component FIT Rate | 5 |
Die FIT Rate | 2 |
Package FIT Rate | 3 |
The failure rate and mission profile information in Table 2-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS,
BICMOS ASICs Analog & Mixed =<50V supply | 20 FIT | 55°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.
The failure mode distribution estimation for PCA9306-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
Channel short | 30% |
Channle open | 30% |
Enable control failure | 30% |
Threshold drift | 10% |
The FMD in Table 3-1 excludes short circuit faults across the isolation barrier. Faults for short circuit across the isolation barrier can be excluded according to ISO 61800-5-2:2016 if the following requirements are fulfilled:
Creepage and clearance requirements should be applied according to the specific equipment isolation standards of an application. Care should be taken to maintain the creepage and clearance distance of a board design to ensure that the mounting pads of the isolator on the printed-circuit board do not reduce this distance.
This section provides a Failure Mode Analysis (FMA) for the pins of the PCA9306-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-6 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality |
B | No device damage, but loss of functionality |
C | No device damage, but performance degradation |
D | No device damage, no impact to functionality or performance |
Figure 4-1 shows the PCA9306-Q1 pin diagram. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the PCA9306-Q1 data sheet.
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
GND | 1 | Normal operation, no effect. | D |
VREF1 | 2 | Communication will be corrupted and possibly cut off. Potential high current draw, and device damage if current is outside of absolute maximum ratings. | A |
SCL1 | 3 | Clock line stuck low, loss of communication. | B |
SDA1 | 4 | Data line stuck low, loss of communication. | B |
SDA2 | 5 | Data line stuck low, loss of communication. | B |
SCL2 | 6 | Clock line stuck low, loss of communication. | B |
VREF2 | 7 | No effect, normal operation if switch path signal voltages are positive. Possible damage to device if switch path signal voltages are negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be plausible. | A |
EN | 8 | Loss of communcation, unable to turn device on. | A |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
GND | 1 | Potential for data corruption. Loss of level translation functionality. | B |
VREF1 | 2 | Potential for data corruption. Loss of level translation functionality. | B |
SCL1 | 3 | Loss of communication | B |
SDA1 | 4 | Loss of communication. | B |
SDA2 | 5 | Loss of communication. | B |
SCL2 | 6 | Loss of communication. | B |
VREF2 | 7 | Potential for data corruption. Loss of level translation functionality. | B |
EN | 8 | Potential for data corruption. Loss of level translation functionality. | B |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|---|
GND | 1 | VREF1 | Communication will be corrupted and possibly cut off. Potential high current draw, and device damage if current is outside of absolute maximum ratings. | A |
VREF1 | 2 | SCL1 | Clock line stuck high, loss of communication. | B |
SCL1 | 3 | SDA1 | Communication will be corrupted, clock and data shorted together. | B |
SDA1 | 4 | SDA2 | Not considered. This is a corner pin. | D |
SDA2 | 5 | SCL2 | Communication will be corrupted, clock and data shorted together. | B |
SCL2 | 6 | VREF2 | Clock line stuck high, loss of communication. | B |
VREF2 | 7 | EN | Normal operation if operated as a level translation device. Unable to disable device if operated as a switch. | B |
EN | 8 | GND | Not considered. This is a corner pin. | D |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
GND | 1 | Communication will be corrupted and possibly cut off. Potential high current draw, and device damage if current is outside of absolute maximum ratings. | A |
VREF1 | 2 | Normal operation, no effect. | D |
SCL1 | 3 | Clock line stuck high, loss of communication. | B |
SDA1 | 4 | Clock line stuck high, loss of communication. | B |
SDA2 | 5 | Clock line stuck high, loss of communication. | B |
SCL2 | 6 | Clock line stuck high, loss of communication. | B |
VREF2 | 7 | Potential for data corruption. Loss of level translation functionality. | B |
EN | 8 | Potential for data corruption. Loss of level translation functionality. | B |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
GND | 1 | Communication will be corrupted and possibly cut off. Potential high current draw, and device damage if current is outside of absolute maximum ratings. | A |
VREF1 | 2 | Loss of level translation functionality. | B |
SCL1 | 3 | Clock line stuck high, loss of communication. | B |
SDA1 | 4 | Clock line stuck high, loss of communication. | B |
SDA2 | 5 | Clock line stuck high, loss of communication. | B |
SCL2 | 6 | Clock line stuck high, loss of communication. | B |
VREF2 | 7 | Normal operation, no effect. | D |
EN | 8 | Normal operation if operated as a level translation device. Unable to disable device if operated as a switch. | B |