SFFS448 March   2022 ISO7041 , ISO7041-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 16-QSOP (SSOP) Package
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 16-QSOP (SSOP) Package

16-QSOP (SSOP) Package

Figure 4-1 shows the ISO7041/ISO7041-Q1 pin diagram for 16-QSOP pakcage. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the ISO7041/ISO7041-Q1 data sheet.

GUID-54C679BA-5439-4A57-A1DF-DECDE42DE750-low.gifFigure 4-1 Pin Diagram (common for 16-QSOP Packages)
Table 4-2 Pin FMA for Device Pins Short-Circuited to Ground
Pin NamePin No.Description of Potential Failure Effect(s)Failure Effect Class
VCC11No power to the device on side-1. Observe that the absolute maximum ratings for all pins of the device are met; otherwise device damage may be plausible. OUTD state undetermined.A
GND12Device continues to function as expected. D
INA3Input signal shorted to ground, so output (OUTA) stuck to low. Communication from INA to OUTA corrupted.B
INB4Input signal shorted to ground, so output (OUTB) stuck to low. Communication from INB to OUTB corrupted.B
INC5Input signal shorted to ground, so output (OUTC) stuck to low. Communication from INC to OUTC corrupted.B
OUTD6OUTD stuck low. Data communication from IND to OUTD lost. Device damage possible if IND is driven high for extended period of time.A
EN17Refresh is enabled.D
GND18Device continues to function as expected. Normal operation.D
GND29Device continues to function as expected. Normal operation.D
EN210Refresh is enabled.D
IND11Input signal shorted to ground, so output (OUTD) stuck to low. Communication from IND to OUTD corrupted.B
OUTC12OUTC stuck low. Data communication from INC to OUTC lost. Device damage possible if INC is driven high for extended period of time.A
OUTB13OUTB stuck low. Data communication from INB to OUTB lost. Device damage possible if INB is driven high for extended period of time.A
OUTA14OUTA stuck low. Data communication from INA to OUTA lost. Device damage possible if INA is driven high for extended period of time.A
GND215Device continues to function as expected. Normal operation.D
VCC216No power to the device on side-2. OUTA/OUTB/OUTC pins state undetermined.B
Table 4-3 Pin FMA for Device Pins Open-Circuited
Pin NamePin No.Description of Potential Failure Effect(s)Failure Effect Class
VCC11Operation undetermined. Either device is unpowered and OUTA/OUTB/OUTC=default logic state, OUTD=undetermined or through internal ESD diode on INA/INB/INC pin, device can power up if any IN is driven to logic high. If IN has current sourcing capability to provide regular operating current of device, ESD diode conducts that current and device damage plausible.A
GND12Device gets return ground through pin8. Normal operation.D
INA3No communication to INA channel possible. OUTA stuck to default state (High for ISO7041/ISO7041-Q1 and Low for ISO7041F/ISO7041F-Q1).B
INB4No communication to INB channel possible. OUTB stuck to default state (High for ISO7041/ISO7041-Q1 and Low for ISO7041F/ISO7041F-Q1).B
INC5No communication to INC channel possible. OUTC stuck to default state (High for ISO7041/ISO7041-Q1 and Low for ISO7041F/ISO7041F-Q1).B
OUTD6State of OUTD undetermined. Data communication from IND to OUTD lost.B
EN17The device outputs are in an undetermined and unknown state.

B

GND18Device gets return ground through pin2. Normal operation.D
GND29Device gets return ground through pin15. Normal operation.D
EN210The device outputs are in an undetermined and unknown state.

B

IND11No communication to IND channel possible. OUTD stuck to default state (High for ISO7041/ISO7041-Q1 and Low for ISO7041F/ISO7041F-Q1).B
OUTC12State of OUTC undetermined. Data communication from INC to OUTC lost.B
OUTB13State of OUTB undetermined. Data communication from INB to OUTB lost.B
OUTA14State of OUTA undetermined. Data communication from INA to OUTA lost.B
GND215Device gets return ground through pin9. Normal operation.D
VCC216Device unpowered on side-2 and state of OUTA/OUTB/OUTC undetermined.B
Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
Pin NamePin No.Shorted toDescription of Potential Failure Effect(s)Failure Effect Class
VCC11GND1No power to the device on side-1. Observe that the absolute maximum ratings for all pins of the device are met; otherwise device damage may be plausible.A
GND12INAInput signal shorted to ground, so output (OUTA) stuck to low. Communication from INA to OUTA corrupted.B
INA3INBCommunication corrupted for either INA or INB channel.B
INB4INCCommunication corrupted for either INA or INB channel.B
INC5OUTDCommunication corrupted for either or both channels. With opposite logic state on both channels, high current can flow between supply and ground and cause possible device damage.A
OUTD6EN1Refresh is disabled if OUTD is a logic high.A
EN17GND1Refresh is enabled.B
GND18EN1Already considered in above row.B
GND29EN2Refresh is enabled.B
EN210INDRefresh is disabled is IND is a logic high.B
IND11OUTCCommunication corrupted for either or both channels. With opposite logic state on both channels, high current can flow between supply and ground and cause possible device damage.A
OUTC12OUTBCommunication corrupted for either or both channels. With opposite logic state on both channels, high current can flow between supply and ground and cause possible device damage.A
OUTB13OUTACommunication corrupted for either OUTA or OUTB channel. Device damage possible if INA and INB try to drive opposite logic state for extended duration creating a short between supply and ground on side-2.A
OUTA14GND2OUTA stuck low. Data communication from INA to OUTA lost. Device damage possible if INA is driven high for extended period of time.A
GND215VCC2No power to the device on side-2. OUTA/OUTB/OUTC pins state undetermined.B
VCC216GND2Already considered in above row.B
Table 4-5 Pin FMA for Device Pins Short-Circuited to supply
Pin NamePin No.Description of Potential Failure Effect(s)Failure Effect Class
VCC11No effect. Normal operation.D
GND12This can create potential difference between pin2 and pin8, causing high current to flow in device and potential device damage.A
INA3INA pin stuck high. Communication corrupted. OUTA state high.B
INB4INB pin stuck high. Communication corrupted. OUTB state high.B
INC5INC pin stuck high. Communication corrupted. OUTC state high.B
OUTD6OUTD stuck high. Data communication from INC to OUTC lost. Device damage possible if IND is driven low for extended period of time.A
EN17Refresh is disabled.

B

GND18This can create potential difference between pin2 and pin8, causing high current to flow in device and potential device damage.A
GND29This can create potential difference between pin9 and pin15, causing high current to flow in device and potential device damage.A
EN210Refresh is disabled.

B

IND11IND pin stuck high. Communication corrupted. OUTD state high.B
OUTC12OUTC stuck high. Communication disrupted. If INC is low for extended duration, OUTC being stuck high creates a short and can damage the device.A
OUTB13OUTB stuck high. Communication disrupted. If INB is low for extended duration, OUTB being stuck high creates a short and can damage the device.A
OUTA14OUTA stuck high. Communication disrupted. If INA is low for extended duration, OUTA being stuck high creates a short and can damage the device.A
GND215This can create potential difference between pin9 and pin15, causing high current to flow in device and potential device damage.A
VCC216Device continues to function as expected. Normal operation.D