SFFS478 February 2024 LM74502-Q1 , LM74502H-Q1
This section provides a Failure Mode Analysis (FMA) for the pins of the LM74502-Q1, LM74502H-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality |
B | No device damage, but loss of functionality |
C | No device damage, but performance degradation |
D | No device damage, no impact to functionality or performance |
Figure 4-1 shows the LM74502-Q1, LM74502H-Q1 pin diagram. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the LM74502-Q1, LM74502H-Q1 data sheet.
The pin FMA is provided under the assumption that the device is operating under the specified ranges within the Recommended Operating Conditions section of the data sheet.
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
EN/UVLO | 1 | Device will not power up and will be in shutdown mode. | B |
GND | 2 | No effect on device behavior. | D |
N.C | 3 | No effect on the device behavior. | D |
VCAP | 4 | Device may heat up and damage due to increased quiescent current. | A |
VS | 5 | Device will not power up. This is equivalent to input supply shorted to ground. | B |
GATE | 6 | External MOSFET will not turn on. Device may heat up and damage due to increased quiescent current. | A |
OV | 7 | Overvoltage functionality will not be available. | B |
SRC | 8 | Device quiescent current may increase. Based on input voltage, external MOSFET may sustain damage due to GATE to SOURCE maximum voltage specification violation. | B |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
EN/UVLO | 1 | Device will not power up and will be in shutdown mode due to internal pull down on EN/UVLO pin. | B |
GND | 2 | Device will not power up. | B |
N.C | 5 | No effect on the device behavior. | D |
VCAP | 4 | Charge pump will not come up. External FET will be off. | B |
VS | 5 | Device will not power up. This is equivalent to input supply not available. | B |
GATE | 6 | External FET will not turn on. | B |
OV | 7 | Overvoltage functionality will not be available. | B |
SRC | 8 | Device will not be able to turn off external FETs completely. System will not have any protection from input reverse polarity after external FETs are turned on. | B |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|---|
EN/UVLO | 1 | GND | Device will not power up and will be in shutdown mode. | B |
GND | 2 | N.C | No effect on the device performance. | D |
N.C | 3 | VCAP | No effect on the device performance. | D |
VCAP | 4 | - | VCAP is the corner pin. No effect on the device performance. | D |
VS | 5 | GATE | External FET will not turn on. Device quiescent current may increase. | B |
GATE | 6 | OV | Device GATE drive will be turned off due to OV comparator trigger. | B |
OV | 7 | SRC | Device GATE drive will be turned off due to OV comparator trigger. Device GATE pin may oscillate between on and off state. | B |
SRC | 8 | - | SRC is the corner pin. No effect on the device performance. | D |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
EN/UVLO | 1 | Device will always be on. | B |
GND | 2 | Device will not power up. It is equivalent to input supply short condition. | B |
N.C | 3 | No effect on the device performance. | D |
VCAP | 4 | Device charge pump will not come up. External FET will be off. | B |
VS | 5 | No effect on the device performance. | D |
GATE | 6 | External FET will be off. | B |
OV | 7 | Device will be off due to OV comparator trigger. | B |
SRC | 8 | Device will not be able to disconnect the load from supply due to input supply to SRC pin shorting. | B |