SFFS480 September 2022 SN6507-Q1
The failure mode distribution estimation for SN6507-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
SW1 and/or SW2 FET stuck off | 48% |
SW1 and/or SW2 FET stuck ON | 38% |
SW1 and/or SW2 output not in timing or voltage specification | 12% |
SW1 and/or SW2 output undetermined | 2% |