SFFS658 july   2023 DAC539G2-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)

3 Failure Mode Distribution (FMD)

The failure mode distribution estimation for the DAC539G2-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.

The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or over stress.

Table 3-1 Die Failure Modes and Distribution
Die Failure ModesFailure Mode Distribution (%)
Digital core - digital interface (communication loss)25
Digital core - state machine (LUT malfunction)17

NVM retention loss

13
Voltage to PWM frequency error5

Voltage to PWM duty cycle error

20

Total unadjusted error (TUE) at output of GPI-to-VOUT

20