SFFS922 July 2024 TLC3555-Q1
This section provides a failure mode analysis (FMA) for the pins of the TLC3555-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality. |
B | No device damage, but loss of functionality. |
C | No device damage, but performance degradation. |
D | No device damage, no impact to functionality or performance. |
Figure 4-1 shows the TLC3555-Q1 pin diagram. For a detailed description of the device pins, see the Pin Configuration and Functions section in the TLC3555-Q1 data sheet.
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
TRIG | 2 | Depending on the circuit configuration, the application is not likely to function because of unexpected output behavior. If RESET is high, the output is forced high and the discharge transistor is turned off. Depending on the circuit configuration, the application is not likely to function as expected due to the fixed output behavior. | B |
OUT | 3 | Depending on the circuit configuration, the device is likely forced into a short-circuit condition with the OUT voltage ultimately forced to the GND voltage. Prolonged exposure to short-circuit conditions can result in long-term reliability issues. | A |
RESET | 4 | The device is forced into the reset state, with the output forced low and the discharge transistor turned on. Depending on the circuit configuration, the application is not likely to function as expected due to the fixed output behavior. | B |
CONT | 5 | Depending on the circuit configuration, the application is not likely to function because of unexpected output behavior and spiked current dissipated though the device. | B |
DISCH | 6 | Depending on the circuit configuration, the application is not likely to function because of an inability to discharge the timing capacitors. | B |
THRES | 7 | Depending on the circuit configuration, the application is not likely to function because of unexpected output behavior. | B |
VDD | 8 | Timer supplies are shorted together leaving the VDD pin at some voltage between the VDD and GND sources (depending on the source impedance). | A |
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
GND | 1 | Negative supply is left floating. The timer ceases to function because no current can source or sink to the device. There is a potential for damage if any input pins are biased. | A |
TRIG | 2 | Depending on the circuit configuration, the application is not likely to function because of unexpected output behavior. | B |
OUT | 3 | No negative feedback or ability for OUT to drive the application. | B |
RESET | 4 | Leaving the RESET pin floating can effect application performance. The weak 1MΩ internal pull-up resistor to the positive supply holds the RESET pin high under most conditions, but can be momentarily overpowered in an electrically noisy environment, possibly causing irregular toggling of the output. | C |
CONT | 5 | Depending on the circuit configuration, the application is not likely to function because of unexpected output behavior. | B |
DISCH | 6 | Depending on the circuit configuration, the application is not likely to function because of an inability to discharge the timing capacitors. | B |
THRES | 7 | Depending on the circuit configuration, the application is not likely to function because of unexpected output behavior. | B |
VDD | 8 | Positive supply is left floating. The timer ceases to function because no current can source or sink to the device. There is a potential for damage if any input pins are biased. | A |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|---|
GND | 1 | 2 | Depending on the circuit configuration, the application is not likely to function because of unexpected output behavior. | B |
TRIG | 2 | 3 | Depending on the circuit configuration, the application is not likely to function because of unexpected output behavior. | B |
OUT | 3 | 4 | Depending on the circuit configuration, the application is not likely to function because of unexpected output behavior. | B |
RESET | 4 | 5 | If the CONT pin is driven externally by a low-impedance source, the RESET pin is pulled to the voltage of the CONT source. If the CONT pin is floating, the RESET pin is pulled to 0.67% of VDD. The resulting value at the RESET pin either forces the device into the reset state, prevents the device from going into the reset state, or possibly causes the reset state to toggle, depending on the exact value. The application is not likely to function properly because of unpredictable behavior. | B |
CONT | 5 | 6 | Depending on the circuit configuration, the application is not likely to function because of unexpected output behavior. | B |
DISCH | 6 | 7 | Depending on the circuit configuration, the application is not likely to function because of unexpected output behavior. | B |
THRES | 7 | 8 | Depending on the circuit configuration, the application is not likely to function because of unexpected output behavior. | B |
VDD | 8 | 1 | Timer supplies are shorted together, leaving the VDD pin at some voltage between the GND and VDD sources (depending on the source impedance). | A |
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
GND | 1 | Timer supplies are shorted together, leaving the GND pin at some voltage between the GND and VDD sources (depending on the source impedance). | A |
TRIG | 2 | Depending on the circuit configuration, the application is not likely to function because of unexpected output behavior. | B |
OUT | 3 | Depending on the circuit configuration, the device is likely forced into a short-circuit condition with the OUT voltage ultimately forced to the VDD voltage. Prolonged exposure to short-circuit conditions can result in long-term reliability issues. | A |
RESET | 4 | The device is unable to enter the reset state. If the application configuration requires the reset state to be asserted, the application does not function as expected. | B |
CONT | 5 | Depending on the circuit configuration, the application is likely not to function due to unexpected output behavior. | B |
DISCH | 6 | Depending on the circuit configuration, the application is not likely to function because of an inability to discharge the timing capacitors. Potential for damage is high because of large currents flowing through the discharge transistor. | A |
THRES | 7 | Depending on the circuit configuration, the application is not likely to function because of unexpected output behavior. | B |