SLLA543 January 2021 THVD2410 , THVD2450
This section provides Functional Safety Failure In Time (FIT) rates for THVD2450 and THVD2410 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) 8-pin SOIC (D) | FIT (Failures Per 109 Hours) 8-pin VSON (DRB) | FIT (Failures Per 109 Hours) 8-pin VSSOP (DGK) |
---|---|---|---|
Total Component FIT Rate | 11 | 18 | 7 |
Die FIT Rate | 3 | 3 | 3 |
Package FIT Rate | 8 | 15 | 4 |
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) 8-pin SOIC (D) | FIT (Failures Per 109 Hours) 8-pin VSON (DRB) | FIT (Failures Per 109 Hours) 8-pin VSSOP (DGK) |
---|---|---|---|
Total Component FIT Rate | 10 | 18 | 7 |
Die FIT Rate | 3 | 3 | 3 |
Package FIT Rate | 7 | 15 | 4 |
The failure rate and mission profile information in Table 2-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS, BICMOS Digital, analog / mixed | 25 FIT | 55°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-3 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.