SLLU342 May 2022 TCAN1462-Q1
Table 1-1 lists the jumper connections for the EVM.
Connection | Type | Description |
---|---|---|
J1 | 3-pin jumper | Used for mode selection on pin 8 (4.7-kΩ pullup to VIO, 0-Ω pulldown to GND, customer-installable pulldown for devices with slew rate control RS pin). |
J2 | 10-pin header | Connection for access to all critical digital I/O, supply, and GND for driving the CAN transceiver externally with test equipment or interfaced to a processor EVM |
J3 | 9-pin DB9 connector |
Provides an optional way to connect CANH, CANL, VCC, and GND all through a standard DB9 CAN pinout rather than through a regular header. |
J4 | 4-pin jumper |
CAN bus connection (CANH, CANL) and GND |
J5 | 2-pin jumper | Connect 120-Ω CAN termination to the bus. Used separately for a single termination if EVM is at end of the CAN bus and termination is not in the cable. Used in combination with JMP5 to get to second CAN termination to represent the combined 60-Ω load for CAN transceiver parametric measurement. |
J6 | 2-pin jumper | Connect 120-Ω CAN termination to the bus. Used in combination with JMP4 to get to second CAN termination to represent the combined 60-Ω load for CAN transceiver parametric measurement. |
J7 |
2-pin jumper |
Connect SIC network to CANH. Must be used in combination with J8. |
J8 |
2-pin jumper |
Connect SIC network to CANL. Must be used in combination with J7. |
J9 |
2-pin jumper |
VCC supply and GND connection for the EVM |
J10 |
2-pin jumper |
VIO and VCC suuply connection. Provides ability to short Vcc and VIO together. |
TP1 | Test Point | Device pin 8 test point |
TP2 | GND test point | |
TP3 | ||
TP4 | ||
TP5 | CANH (bus) test point | |
TP6 | TXD, Device pin 1 test point | |
TP7 | RXD, Device pin 4 test point | |
TP8 | VIO, Device pin 5 test point | |
TP9 |
CANL (bus) test point |
|
TP10 |
VCC test point |
|
TP11 |
GND test point |