The purpose of this study was to characterize the effects of heavy-ion irradiation on the single-event latch-up (SEL) performance of the TLV1704-SEP 2.2V to 24V, microPower comparator. Heavy-ions with an LETEFF of 43MeV-cm2/ mg were used to irradiate the devices with a fluence of 1 × 107 ions/cm2. The results demonstrate that the TLV1704-SEP is SEL-free up to LETEFF = 43MeV-cm2/ mg at 125°C. Characterization of single-event transients (SET) was also performed, up to a surface LETEFF = 50MeV-cm2 / mg at 125°C.
All trademarks are the property of their respective owners.
The TLV1704-SEP (Quad) device offers a wide supply range, rail-to-rail inputs, low quiescent current, and low propagation delay. All these features come in industry-standard, extremely-small packages, making these devices the best general-purpose comparators available. The open collector output offers the advantage of allowing the output to be pulled to any voltage rail up to +24 V above the negative power supply regardless of the TLV1704-SEP supply voltage. The device is a microPower comparator. Low input offset voltage, low input bias currents, low supply current, and open-collector configuration makes the TLV1704-SEP device flexible enough to handle almost any application, from simple voltage detection to driving a single relay.
www.ti.com/product/TLV1704-SEP/technicaldocuments
| DESCRIPTION | DEVICE INFORMATION |
|---|---|
| TI Part Number | TLV1704-SEP |
| MLS Number | TLV1704AMPWTPSEP |
| Device Function | Radiation Hardened microPower Quad Comparator in Space Enhanced Plastic |
| Technology | BICOM3XHV |
| Exposure Facility | Facility for Rare Isotope Beams, Michigan State University |
| Heavy Ion Fluence per Run | 1×107 ions/cm2 |
| Irradiation Temperature | 125°C (for SEL testing) |
