SLVAEV4 June   2020 DRV8876-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 HTSSOP Package

1 Overview

This document contains information for DRV8876-Q1 to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (Pin FMA)

DRV8876-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.

Figure 1-1 shows the functional block diagram for reference.

GUID-F968A28E-7376-441C-A624-56905323F04A-low.gifFigure 1-1 DRV8876-Q1 Device Block Diagram - HW variant