SLVAFG8 February   2023 TPS22995H-Q1

 

  1.   Abstract
  2.   Trademarks
  3. 1Test setup
    1. 1.1 Schematic
    2. 1.2 Layout
    3. 1.3 Test Conditions
  4. 2Results
    1. 2.1 Functional Test Results
    2. 2.2 Base Measurements
    3. 2.3 Test 1: 100 kΩ Short From RT to GND 5 V
    4. 2.4 Test 2: 100 kΩ Short From RT to GND 1.8 V
    5. 2.5 Test 3: 100kΩ short from RT to VIN 5V
    6. 2.6 Test 4: 100 kΩ Short From RT to VIN 1.8 V
    7. 2.7 Test 5: 100 kΩ Short From RT to VOUT 5 V
    8. 2.8 Test 6: 100 kΩ Short From RT to VOUT 1.8 V
  5. 3Summary
  6. 4References
  7. 6Appendix A

Test Conditions

Test 1 conditions: 100 kΩ Short From RT to GND

  • VIN = 5 V
  • VBIAS = 5 V
  • CIN = 1 µF
  • RT = 1 kΩ
  • RLOAD = 100 Ω
  • COUT = 0.1 µF

Test 2 Conditions: 100 kΩ Short From RT to GND

  • VIN = 1.8 V
  • VBIAS = 1.8 V
  • CIN = 1 µF
  • RT = 1 kΩ
  • RLOAD = 100 Ω
  • COUT = 0.1 µF

Test 3 Conditions: 100kΩ Short From RT to VIN

  • VIN = 5 V
  • VBIAS = 5 V
  • CIN = 1 µF
  • RT = 1kΩ
  • RLOAD = 100Ω
  • COUT = 0.1µF

Test 4 Conditions: 100 kΩ Short From RT to VIN

  • VIN = 1.8 V
  • VBIAS = 1.8 V
  • CIN = 1 µF
  • RT = 1 kΩ
  • RLOAD = 100 Ω
  • COUT = 0.1 µF

Test 5 Conditions: 100 kΩ Short From RT to VOUT

  • VIN = 5 V
  • VBIAS = 5 V
  • CIN = 1 µF
  • RT = 1 kΩ
  • RLOAD = 100 Ω
  • COUT = 0.1 µF

Test 6 Conditions: 100 kΩ Short From RT to VOUT

  • VIN = 1.8 V
  • VBIAS = 1.8 V
  • CIN = 1 µF
  • RT = 1 kΩ
  • RLOAD = 100 Ω
  • COUT = 0.1 µF