SLVK086A january   2022  – may 2023 TPS7H4003-SEP

PRODUCTION DATA  

  1.   1
  2.   Single-Event Effects Test Report of the TPS7H4003-SEP Synchronous Step-Down Converter
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A Appendix: Total Ionizing Dose From SEE Experiments
  15.   B Appendix: References
  16.   C Revision History

7.1 Single-Event Latch-up (SEL) Results

During SEL characterization, the device was heated using forced hot air, maintaining the DUT temperature at 125°C. The die temperature was monitored during the testing using a T-Type thermocouple attached to the thermal pad vias (on the bottom side of the EVM) with thermal paste. The thermocouple was held in-place by using high temperature tape (kapton-tape). Die-to-thermocouple temperature was verified using a IR-camera.

The species used for the SEL testing was a silver (109Ag) ion with an angle-of-incidence of 0° for an LETEFF = 48.2 MeV·cm2/mg (for more details refer to Section 5). The kinetic energy in the vacuum for this ion is 1.634 GeV (15-MeV/amu line). Flux of approximately 105 ions/cm2·s and a fluence of approximately 107 ions/cm2 were used for the five runs. Run duration to achieve this fluence was approximately 2 minutes. The three devices were powered up and exposed to the heavy-ions using 6.5 V and the maximum recommended voltage of 7 V and maximum load of 18 A. No SEL events were observed during all four runs, indicating that the TPS7H4003-SEP is SEL-free.Table 8-3 shows the SEL test conditions and results. Figure 7-2 shows a plot of the current vs time for run # 1.

Table 7-1 Summary of TPS7H4003-SEP SEL Test Condition and Results
RUN # UNIT # ION LETEFF
(MeV·cm2/mg)		 FLUX
(ions·cm2/mg)		 FLUENCE
(# ions)		 VIN (V)
1 1 109Ag 48.2 9.79 × 104 1 × 107

6.5
2

1

 109Ag 48.2 7.06 × 104 9.96 × 107

7
3

2

 109Ag 48.2 8.56 × 104 1 × 107

6.5
4

2

 109Ag 48.2 1.1 × 105 1 × 107

7

5

3

 109Ag 48.2

1.16 × 105

 9.96 × 106

7
Using the MFTF method described in Single-Event Effects (SEE) Confidence Interval Calculations application report and combining (or summing) the fluence of the five runs @ 125°C (5.00 × 107), the upper-bound cross-section (using a 95% confidence level) is calculated as:

σSEL ≤ 7.38 × 10–8 cm2/device for LETEFF = 48.2 MeV·cm2/mg and T = 125°C.

GUID-20211207-SS0I-PN79-ZLJJ-GVD3BRRQ3HJW-low.png Figure 7-1 Current vs Time for Run # 1 of the TPS7H4003-SEP at T = 125°C