SLVK086A january   2022  – may 2023 TPS7H4003-SEP

PRODUCTION DATA  

  1.   1
  2.   Single-Event Effects Test Report of the TPS7H4003-SEP Synchronous Step-Down Converter
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A Appendix: Total Ionizing Dose From SEE Experiments
  15.   B Appendix: References
  16.   C Revision History

1 Introduction

The TPS7H4003-SEP is an space-enhanced-plastic, 3-V to 7-V input, 18-A, synchronous step-down buck point-of-load (POL) voltage converter. The device provides exceptional efficiency and output accuracy in a very small design size. Along with the small design size, the configurable switching frequency (0.1 to 1 MHz), can reduce the output filter lumped components, optimizing the power density (W/in3). The TPS7H4003-SEP has many use cases, as well as circuit protection capabilities, enabled by the following features:

  • A voltage start-up ramp controlled by the SS/TR pin for different operations.
  • Power sequencing through enable and power good configurations.
  • Ability to configure in primary-secondary mode depending on the SYNC2 pin.
  • Cycle-by-cycle current limiting on high-side FET to protect the device in overload situations.
  • Low-side-sourcing current protection to prevent current runaway.
  • Low-side-sinking current protection turns off low-side MOSFET to prevent reverse current.
  • Thermal shutdown disables the part when die temperature exceeds thermal limit.

The device is offered in a 44-pin plastic package. General device information and test conditions are listed in Table 1-1. For more detailed technical specifications, user guides, and application notes, see the TPS7H4003-SEP product page.

Table 1-1 Overview Information
DESCRIPTION(1) DEVICE INFORMATION
TI Part Number TPS7H4003-SEP
Orderable Number TPS7H4003MDDWSEP
Device Function Point-of-load (POL) switching regulator
Technology LBC7
Exposure Facility Radiation Effects Facility, Cyclotron Institute, Texas A&M University (15 MeV/nucleon)
Heavy Ion Fluence per Run 9.95 × 106 – 1 × 107 ions/cm2
Irradiation Temperature 25°C (for SET and SEB/SEGR testing) and 125°C (for SEL testing)
(1) TI may provide technical, applications or design advice, quality characterization, and reliability data or service, providing these items shall not expand or otherwise affect TI's warranties as set forth in the Texas Instruments Incorporated Standard Terms and Conditions of Sale for Semiconductor Products and no obligation or liability shall arise from Semiconductor Products and no obligation or liability shall arise from TI's provision of such items.