SLVK145 august   2023 TPS7H2201-SEP

PRODUCTION DATA  

  1.   1
  2.   Single-Event Effects Test Report of the TPS7H2201-SEP eFuse
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-Up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
    1. 8.1 Single Event Transients
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A References

10 Summary

The purpose of this study was to characterize the effect of heavy-ion irradiation on the Single-Event-Effect (SEE) performance of the TPS7H2201-SEP eFuse. Heavy-ions with LETEFF = 48 MeV∙cm2/mg were used for the SEE test campaign. Flux of 105ions/cm2∙s and fluences ranging from 9.97 × 106 to 1 × 107 ions/cm2 per run were used for the characterization. The SEE results demonstrated that the TPS7H2201-SEP is SEL and SEB/SEGR free up to LETEFF = 48 MeV∙cm2/mg up to 7 V when using 109Ag heavy-ions. The device is SET-free up to LETEFF = 48 MeV∙cm2/mg, which shows the robustness of the device to SET over the whole electrical and radiation range. CREME96-based worst-week event-rate calculations for LEO (ISS) and GEO orbits are shown for reference.