SLVK145 august   2023 TPS7H2201-SEP

PRODUCTION DATA  

  1.   1
  2.   Single-Event Effects Test Report of the TPS7H2201-SEP eFuse
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-Up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
    1. 8.1 Single Event Transients
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A References

1 Introduction

The TPS7H2201-SEP is a radiation-tolerant, 1.5-V to 7-V input, 6-A, single channel eFuse. The device provides reverse current protection, overvoltage protection, and a configurable rise time. The device contains a P-channel MOSFET which operates over the full input range and supports the maximum 6-A of continuous current. The switch is controlled through the active-high Enable (EN) input pin, which is capable of interfacing directly with low-voltage control signals.

The device is offered in a 32-pin plastic package (HTSSOP). Table 1-1 lists general device information and test conditions. For more detailed technical specifications, user's guides, and application notes, please go to the TPS7H2201-SEP product page.

Table 1-1 Overview Information
Description(1)Device Information
TI part numberTPS7H2201-SEP
Orderable numberTPS7H2201MDAPTSEP
Device functioneFuse
Technology250-nm linear BiCMOS 7 (LBC7)
Exposure facilityRadiation Effects Facility, Cyclotron Institute, Texas A&M University (15 MeV/nucleon)
Heavy ion fluence per run≈ 1 × 107 ions/cm2
Irradiation temperature25°C (for SEB testing), 25°C (for SET testing), and 125°C (for SEL testing)
(1) TI may provide technical applications or design advice, quality characterization, and reliability data or service. Providing these items shall not expand or otherwise affect TI's warranties as set forth in the Texas Instruments Incorporated Standard Terms and Conditions of Sale for Semiconductor Products. No obligation or liability shall arise from Semiconductor Products, and no obligation or liability shall arise from TI's provision of such items.