SLVK145
august 2023
TPS7H2201-SEP
PRODUCTION DATA
1
Single-Event Effects Test Report of the TPS7H2201-SEP eFuse
Trademarks
1
Introduction
2
Single-Event Effects
3
Device and Test Board Information
4
Irradiation Facility and Setup
5
Depth, Range, and LETEFF Calculation
6
Test Setup and Procedures
7
Destructive Single-Event Effects (DSEE)
7.1
Single-Event Latch-Up (SEL) Results
7.2
Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
8
Single-Event Transients (SET)
8.1
Single Event Transients
9
Event Rate Calculations
10
Summary
A References
7
Destructive Single-Event Effects (DSEE)