SLVK145 august   2023 TPS7H2201-SEP

PRODUCTION DATA  

  1.   1
  2.   Single-Event Effects Test Report of the TPS7H2201-SEP eFuse
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-Up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
    1. 8.1 Single Event Transients
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A References

8.1 Single Event Transients

SETs are defined as heavy-ion-induced transients upsets on the VOUT and the Soft-Start (SS) flag of the TPS7H2211-SP. SET testing was performed at room temperature (no external temperature control applied). The species used for the SET testing was Silver (109Ag) ion with an angle-of-incidence of 0° for an LETEFF = 48 MeV∙cm2/mg respectively, for more details, refer to Depth, Range, and LETEFF Calculation. Flux of approximately 105 ions/cm2∙s and a fluence of approximately 107 ions/cm2 were used for the 12 SET runs.

VOUT SETs were characterized using a window trigger of ±3% around the nominal output voltage (≈ 1.5 V to 7 V). The devices were characterized with input voltages ranging from VIN = 1.5 V (minimum) to VIN = 7 V (maximum). The output load was set to 0 or 6 Amps for each run by using a Chroma Load on Constant-Resistance (CR) mode. To capture the SET's two NI-PXI-5172 continuously monitoring the VOUT and the SS were used, respectively. Each scope was operated independently. The output voltage was monitored by using the TP6 and the TP10 test points on the EVM, while the SS was monitored using the TP8 test point.

The scope triggering from VOUT was programmed to record 20 k samples with a sample rate of 5-M samples per second (S/s) in case of a event (trigger). The scope triggering from SS was programmed with 30 ks and 5 MS/s. Both scopes were programmed to record 20% of the data before (pre) the trigger happen.

Not a single upset on VOUT or SS was observed. Table 8-1 lisrs the SET test condition and results for all of the data.

Table 8-1 Summary of TPS7H2201-SEP SET Test Condition and Results
Run NumberUnit NumberIonLETEFF (MeV.cm2/mg)Flux (ions·cm2/s)Fluence (ions·cm2)VIN (V)Enabled

VOUTSET ≥ |3% |

SSSET at 25 °CLoad Type (Chroma)Load Value
104109Ag481.15 × 1051.00 × 1077Yes00CR3.5
114109Ag489.17 × 1041.00 × 1077Yes00N/A0
124109Ag489.89 × 1041.00 × 1075Yes00CR3.5
134109Ag489.97 × 1041.00 × 1075Yes00N/A0
144109Ag488.66 × 1041.00 × 1071.5Yes00CR3.5
154109Ag487.96 × 1041.00 × 1071.5Yes00N/A0
165109Ag488.60 × 1041.01 × 1077Yes00CR3.5
175109Ag488.94 × 1041.00 × 1077Yes00N/A0
185109Ag489.18 × 1041.00 × 1075Yes00CR3.5
195109Ag489.28 × 1041.00 × 1075Yes00N/A0
205109Ag488.84 × 1041.00 × 1071.5Yes00CR3.5
215109Ag489.14 × 1041.00 × 1071.5Yes00N/A0

The upper-bound cross-section (using a 95% confidence level) is calculated by combining all runs above as:

σSET ≤ 3.12 × 10–8 cm2/device for LETEFF = 48 MeV·cm2/mg and T = 25°C. Since no VOUT or SS SETs were observed, this cross section is valid for both cases.